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| '''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/LabAdviser/CEN click here]''' | | '''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/LabAdviser/CEN click here]''' |
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| ==SEM's== | | =This page gives an overview of the electron microscope equipment and other related resources connected to DTU Nanolab - building 307/314= |
| *[[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|SEM Comparison page - both Danchip and CEN SEM's]]
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| *[[Specific Process Knowledge/Characterization/SEM FEI Nova 600 NanoSEM|SEM FEI Nova 600 NanoSEM]]
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| *[[Specific Process Knowledge/Characterization/SEM FEI Quanta 200 ESEM FEG|SEM FEI Quanta 200 ESEM FEG]]
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| *[[Specific Process Knowledge/Characterization/SEM Inspect S|SEM Inspect S]]
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| ==Dual Beam's== | | ==SEM== |
| *[[Specific Process Knowledge/Characterization/SEM FEI QUANTA 200 3D|Quanta 3D FIB/SEM]] | | *[[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|SEM Comparison page - all of DTU Nanolabs SEMs]] |
| *[[Specific Process Knowledge/Characterization/Dual Beam FEI Helios Nanolab 600|Helios NanoLAB 600]] | | *[[/Nova NanoSEM 600|Nova NanoSEM 600]] |
| | *[[/Quanta FEG 200 ESEM|QFEG 200 Cryo ESEM]] |
| | *[[/AFEG 250 Analytical SEM|AFEG 250 Analytical ESEM]] |
| | <!-- *[[/Inspect S|Inspect S]] --> |
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| ==TEM's== | | ==Dual Beam== |
| *[[Specific Process Knowledge/Characterization/TEM| TEM comparison page]] | | <!-- *[[/Quanta 3D FIB/SEM|Quanta 3D FIB/SEM]] --> |
| *[[Specific Process Knowledge/Characterization/Titan ATEM |Titan ATEM]] | | *[[/Helios Nanolab 600|Helios NanoLAB 600]] |
| *[[Specific Process Knowledge/Characterization/Titan ETEM |Titan ETEM]] | | |
| *[[Specific Process Knowledge/Characterization/Tecnai TEM |Tecnai TEM]] | | ==TEM== |
| *[[Specific Process Knowledge/Characterization/TEM/Sample Holders|TEM sample holders - under construction]] | | *[[/Titan ATEM |Titan ATEM]] |
| | *[[/Titan ETEM |Titan ETEM]] |
| | *[[/Tecnai TEM |Tecnai T20 TEM]] |
| | *[[/Tecnai T12 Junior TEM |Tecnai T12 Junior TEM]] |
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| ==Ancillary Equipment== | | ==Ancillary Equipment== |
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| ==Post Processing== | | ==Post Processing== |
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| *[[/Post Processing|Resources for Post Processing - under construction]] | | *[[/Post Processing|Resources for Post Processing]] |
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| At DTU Cen you will find a small PC lab where there is access to all the processing and productivity software available at DTU Cen. The lab is located in building 307 room 101.There are five workstations which you can access with your DTU credentials. The following software is installed on all workstations:
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| Microsoft Office 2010
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| Digital Micrograph v1.85 (TEM image processing and analysis)
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| TIA v4.7 SP2 (TEM/STEM image processing and analysis) (ask Cen staff for access)
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| JEMS v4.3905 (TEM/STEM/Diffraction analysis and simulation)
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| AZtec v3.1b (SEM and TEM) (EDX spectrum and map analysis)
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| INCA v5.0.5 (EDX analysis)
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| Avizo v9.0.1 (3D rendering)
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| Crystalmaker v9.2.7 (Crystal structure building)
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| Crystaldiffract v6.5.5 (Diffraction analysis)
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| Single crystal v2.3.3 (Diffraction from single crystals)
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| Additionally, some of the workstations have node-locked licenses to:
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| PANalytical X’pert Highscore Plus (XRD data analysis): Cen-Himmelbjerg, Cen-Froebjerg, Cen-Valbybakke
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| Inspect 3D (Tomography reconstruction): Cen-Himmelbjerg, Cen-Froebjerg
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| TrueImage v2.0.1 (TEM image reconstruction): Cen-Himmelbjerg, Cen-Froebjerg, Cen-Valbybakke, Cen-Yding
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| Esprit 2.0 (EBSD analysis): Cen-Himmelbjerg, Cen-Froebjerg, Cen-Valbybakke, Cen-Yding
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| Please remember to log out when you have finished your work. Do not turn off the workstations.
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