Specific Process Knowledge/Characterization/XRD/XRD SmartLab/Instrumental broading in T2T: Difference between revisions
Created page with " This page describes the values of instrumental broadening in θ/2θ measurements and can be used as a reference for peak broadening in grain size calculation. The most common slit configuration cases are chosen, both with and without the Ge220 monochromator. The instrumental broadening has been measured by using standard Si and LaB<sub>6</sub> powder. Scherrer formula: <math>D=\frac{K\cdot\lambda}{\beta_{sample}\cdot cos\theta}</math> where: K is Scherrer constant..." |
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<i>This page is written by <b>Evgeniy Shkondin @DTU Nanolab</b> if nothing else is stated. <br> | |||
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The fabrication and characterization described below were conducted in <b>2024 by Evgeniy Shkondin, DTU Nanolab</b>.<br></i> | |||
This page describes the values of instrumental broadening in θ/2θ measurements and can be used as a reference for peak broadening in grain size calculation. The most common slit configuration cases are chosen, both with and without the Ge220 monochromator. | This page describes the values of instrumental broadening in θ/2θ measurements and can be used as a reference for peak broadening in grain size calculation. The most common slit configuration cases are chosen, both with and without the Ge220 monochromator. | ||