Specific Process Knowledge/Thin film deposition/Deposition of ZnO: Difference between revisions

From LabAdviser
Bghe (talk | contribs)
No edit summary
Paphol (talk | contribs)
No edit summary
 
(3 intermediate revisions by 2 users not shown)
Line 1: Line 1:
'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_ZnO  click here]'''  
'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_ZnO  click here]'''  


<i> Unless otherwise stated, this page is written by <b>DTU Nanolab internal</b></i>


ZnO can be deposited by Sputtering process and atomic layer deposition (ALD). In the chart below you can compare the different deposition equipment.
ZnO can be deposited by Sputtering process and atomic layer deposition (ALD). In the chart below you can compare the different deposition equipment.


*[[Specific Process Knowledge/Thin film deposition/ALD Picosun R200/ZnO deposition using ALD|ZnO deposition using ALD]]
*[[Specific Process Knowledge/Thin film deposition/ALD Picosun R200/ZnO deposition using ALD|ZnO deposition using ALD]]
*[[Specific Process Knowledge/Thin film deposition/Deposition of ZnO/ZnO deposition in Sputter System (Lesker)|ZnO deposition in Sputter System (Lesker)]]


{| border="1" cellspacing="0" cellpadding="4"  
{| border="1" cellspacing="0" cellpadding="4"  

Latest revision as of 13:55, 6 June 2023

Feedback to this page: click here

Unless otherwise stated, this page is written by DTU Nanolab internal

ZnO can be deposited by Sputtering process and atomic layer deposition (ALD). In the chart below you can compare the different deposition equipment.


Sputtering deposition (Lesker) Atomic layer deposition (ALD Picosun R200)
General description Sputter deposition of ZnO Atomic layer deposition of ZnO
Pre-clean RF Ar clean
Layer thickness 10Å to 5000Å* 0 to 1000 Å
Deposition rate Depending on process parameters. Depending on temperature
Batch size
  • Pieces or
  • 1x4" wafer or
  • 1x6" wafer
  • Pieces or
  • 1x4" wafer or
  • 1x6" wafer or
  • 1x8" wafer
Allowed materials
  • Silicon
  • Silicon oxide
  • Silicon nitride
  • Silicon (oxy)nitride
  • Photoresist
  • PMMA
  • Mylar
  • SU-8
  • Metals
  • Carbon
  • Silicon
  • Silicon oxide, silicon nitride
  • Quartz/fused silica
  • Al, Al2O3
  • Ti, TiO2
  • Other metals (use dedicated carrier wafer)
  • III-V materials (use dedicated carrier wafer)
  • Polymers (depending on the melting point/deposition temperature, use carrier wafer)


Comment
  • Use 2 inch target
  • Substrate rotation
  • Substrate RF Bias (optional)

* For thicknesses above 200 nm permission is required.