Specific Process Knowledge/Etch/Etching of Silicon Oxide/SiO2 etch using ASE/ICP recipe for SiO2: Difference between revisions

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|?
|?
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|Etch rate in PECVD nitride
|Etch rate in resist (AZ 5214E)
|.
|108 nm/min in the center, 98nm/min in the edges
|20.8nm/min (''kabi@nanolab 20190301'') - ~0nm/min (''ecsj@nanolab 20210729'')
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|Etch rate in LPCVD nitride
|.
|23.7 nm/min in the middle, 17 nm/min close to the edge
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|Etch rate in resist (MIR)
|12.5 nm/min
|13.9 nm/min
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|-
|Selectivity (SiO2:resist)
|Selectivity (SiO2:resist)
|1.8
|1.45
|1.9
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Revision as of 15:15, 15 May 2023

This recipe was taken from the ICP Metal etch, with a slight difference in the platen temperature.


Parameter Recipe name: SiO2_ICP
Coil Power [W] 1000
Platen Power [W] 200
Platen temperature [oC] 20
C4F8 flow [sccm] 10
H2 flow [sccm] 28
Pressure [mTorr] 2.5

Results when etching a patterned wafer

Material to be etched Recipe: SIO2_ICP Testing othe etch rate in nitride
Etch rate in SiO2 155 nm/min in the center, 125nm/min in the edges. ?
Etch rate in resist (AZ 5214E) 108 nm/min in the center, 98nm/min in the edges
Selectivity (SiO2:resist) 1.45
Etch rate in silicon
  • 4 nm/min in the middle of the wafer (80% load) bghe@Nanolab 20190117
  • 2-3 nm/min at the edge of the wafer (80% load) bghe@Nanolab 20190117
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