Specific Process Knowledge/Etch/III-V RIE: Difference between revisions
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==III-V RIE Plassys== | ==III-V RIE Plassys== | ||
Name: MG300 RIE <br> | |||
Vendor: Plassys <br> | |||
== General information == | == General information == | ||
[[Image:III-V RIE Plassys.jpg|right|250px|thumb| III-V RIE is | [[Image:III-V RIE Plassys.jpg|right|250px|thumb| III-V RIE is located in room A-1]] | ||
Dry etching of III-V compound semiconductors is performed with a conventional Reactive Ion Etch (RIE) located in cleanroom 1. The III-V RIE is a Plassys model MG300. Find the company website her: [http://www.plassys.com/ Plassys]. | Dry etching of III-V compound semiconductors is performed with a conventional Reactive Ion Etch (RIE) located in cleanroom A-1. The III-V RIE is a Plassys model MG300. Find the company website her: [http://www.plassys.com/ Plassys]. | ||
The system is equipped with a laser interferometer to monitor etch-rate and -depth. | The system is equipped with a laser interferometer to monitor etch-rate and -depth. | ||
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The diameter of the quartz plate is 20 cm, ie up to | The diameter of the quartz plate is 20 cm with a recess for 4" wafers, ie up to one 4" wafer, one 3" wafer or one 2" wafer or several smaller samples can be processed simultaneously. To strike a plasma, the applied power should be 50 W or more; if a process needs a lower power during etch it is necessary to initially strike the plasma with eg 50 W (higher powers are needed for lower gas pressures) for 5-10 sec where after the power can be lowered to the desired value. | ||
The chamber should be cleaned after '''all''' usage of the machine; read more under [[/III_V_RIE_ETCHES#Chamber Cleaning|Chamber Cleaning]]. | The chamber should be cleaned after '''all''' usage of the machine; read more under [[/III_V_RIE_ETCHES#Chamber Cleaning|Chamber Cleaning]]. | ||
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|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*SiO<sub>2</sub> | *SiO<sub>2</sub> | ||
*Si<sub>3</sub> | *Si<sub>3</sub>N<sub>4</sub> | ||
*BCB | *BCB | ||
*Resist | *Resist | ||
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|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*SiO<sub>2</sub>: ~1-30 nm/min | *SiO<sub>2</sub>: ~1-30 nm/min | ||
*Si<sub>3</sub> | *Si<sub>3</sub>N<sub>4</sub>: ~17-38 nm/min | ||
*BCB: ~70-880 nm/min (needs testing) | *BCB: ~70-880 nm/min (needs testing) | ||
*Resist: ~30-98 nm/min (AZ5206 and ZEP520A), ~70-815 nm/min (AZ5214) | *Resist: ~30-98 nm/min (AZ5206 and ZEP520A), ~70-815 nm/min (AZ5214) | ||
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*20 cm | *20 cm | ||
|- | |- | ||
| style="background:LightGrey; color:black"| | | style="background:LightGrey; color:black"|Material allowed | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
* III-V compound semiconductors | * III-V compound semiconductors | ||
* Silicon based materials | |||
* Photoresist/e-beam resist | |||
* BCB | |||
*Photoresist/e-beam resist | * For other materials, please ask | ||
* | |||
|- | |- | ||
|} | |} |
Latest revision as of 16:10, 22 March 2023
Feedback to this page: click here
Unless otherwise stated, this page is written by DTU Nanolab internal
III-V RIE Plassys
Name: MG300 RIE
Vendor: Plassys
General information
Dry etching of III-V compound semiconductors is performed with a conventional Reactive Ion Etch (RIE) located in cleanroom A-1. The III-V RIE is a Plassys model MG300. Find the company website her: Plassys.
The system is equipped with a laser interferometer to monitor etch-rate and -depth.
The user manuals, user APVs, technical information and contact information can be found in LabManager:
The diameter of the quartz plate is 20 cm with a recess for 4" wafers, ie up to one 4" wafer, one 3" wafer or one 2" wafer or several smaller samples can be processed simultaneously. To strike a plasma, the applied power should be 50 W or more; if a process needs a lower power during etch it is necessary to initially strike the plasma with eg 50 W (higher powers are needed for lower gas pressures) for 5-10 sec where after the power can be lowered to the desired value.
The chamber should be cleaned after all usage of the machine; read more under Chamber Cleaning.
Process information
- CHF3/O2 RIE - SiO2 and Si3Ni4 etch
- CH4/H2 RIE - InP and InGaAs(P) etch
- BCB polymer RIE - BCB polymer and resist etch
- Chamber Cleaning - Chamber cleaning
Purpose | Dry etch of |
|
---|---|---|
Performance (see specific recipes) | Etch rates |
|
Anisotropy |
| |
Process parameters | Plasma pressure |
|
Maximum Gas flows |
| |
Substrates | diameter of quartz plate |
|
Material allowed |
|