Specific Process Knowledge/Back-end processing/Polisher CMP: Difference between revisions
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'''Unless anything else is stated, everything on this page, text and pictures are made by DTU Nanolab.''' | |||
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'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Back-end_processing/Polisher_CMP click here]''' | '''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Back-end_processing/Polisher_CMP click here]''' | ||
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== Polisher (CMP) == | == Polisher (CMP) == | ||
[[image:Cmp_picture.jpg|400px|right|thumb|The Logitech PM5 Polisher/Lapper]] | [[image:Cmp_picture.jpg|400px|right|thumb|The Logitech PM5 Polisher/Lapper in cleanroom A-5]] | ||
The Logitech Orbis Polisher (CMP) is for polishing wafers (removing material in the nm range) it is not for thinning down wafers or other substrates. | The Logitech Orbis Polisher (CMP) is for polishing wafers (removing material in the nm range) it is not for thinning down wafers or other substrates. After CMP it is recommended to use the '''[http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Wafer_cleaning/Post_CMP_Cleaner Post CMP Cleaner]''' to clean the sample for slurry residues left by the CMP. | ||
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<!-- give the link to the equipment info page in LabManager: --> | <!-- give the link to the equipment info page in LabManager: --> | ||
[http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=430 The Logitech Orbis (CMP) in LabManager] | [http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=430 The Logitech Orbis (CMP) in LabManager] | ||
==Equipment performance and process related parameters== | ==Equipment performance and process related parameters== | ||
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!style="background:silver; color:black;" align="center" width="60"|Purpose | !style="background:silver; color:black;" align="center" width="60"|Purpose | ||
|style="background:LightGrey; color:black"| | |style="background:LightGrey; color:black"| | ||
Polishing of | |||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*Silicon | *Silicon | ||
* | *SiO2 | ||
<!-- |style="background:WhiteSmoke; color:black"| | <!-- |style="background:WhiteSmoke; color:black"| | ||
*Purpose 1 | *Purpose 1 | ||
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|- | |- | ||
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Performance | !style="background:silver; color:black" align="center" valign="center" rowspan="2"|Performance | ||
|style="background:LightGrey; color:black"| | |style="background:LightGrey; color:black"| 20x20mm substrate | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*Removal rate: | *Removal rate: 400nm/min | ||
*Thickness accuracy: +/- | *Thickness accuracy: +/- ? µm | ||
*Thickness homogeneity: +/- | *Thickness homogeneity: +/- ? µm | ||
*Roughness: +/- ? µm | *Roughness: +/- ? µm | ||
<!-- |style="background:WhiteSmoke; color:black"| | <!-- |style="background:WhiteSmoke; color:black"| | ||
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*Performance range 3 --> | *Performance range 3 --> | ||
|- | |- | ||
|style="background:LightGrey; color:black"| | |style="background:LightGrey; color:black"|100mm substrate | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*Removal rate: ~ | *Removal rate: ~ 60 nm/min | ||
*Thickness accuracy: ? µm | *Thickness accuracy: ? µm | ||
*Thickness homogeneity: ? µm | *Thickness homogeneity: ? µm | ||
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|style="background:LightGrey; color:black"|Polishing liquid | |style="background:LightGrey; color:black"|Polishing liquid | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*SF1 Polishing Fluid | |||
*SF1 Polishing Fluid | |||
|- | |- | ||
|style="background:LightGrey; color:black"|Polishing cloths | |style="background:LightGrey; color:black"|Polishing cloths | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*Chemcloth Polishing Cloths | *Chemcloth Polishing Cloths | ||
|- | |- | ||
|style="background:LightGrey; color:black"|Rotation | |style="background:LightGrey; color:black"|Rotation | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
* | *Plate | ||
* | *Head/Puck | ||
|- | |- | ||
|style="background:LightGrey; color:black"|Arm sweep | |style="background:LightGrey; color:black"|Arm sweep | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*Polishing: 20% (inner) - 100% (outer) | |||
*Polishing: | |||
|- | |- | ||
!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | ||
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*one 2" wafer | *one 2" wafer | ||
*one 100 mm wafer | *one 100 mm wafer | ||
*one | *one 150 mm wafer | ||
<!-- |style="background:WhiteSmoke; color:black"| | <!-- |style="background:WhiteSmoke; color:black"| | ||
*<nowiki>#</nowiki> small samples | *<nowiki>#</nowiki> small samples |
Latest revision as of 15:21, 6 February 2023
Unless anything else is stated, everything on this page, text and pictures are made by DTU Nanolab.
All links to Kemibrug (SDS) and Labmanager Including APV and QC requires login.
Feedback to this page: click here
Polisher (CMP)
The Logitech Orbis Polisher (CMP) is for polishing wafers (removing material in the nm range) it is not for thinning down wafers or other substrates. After CMP it is recommended to use the Post CMP Cleaner to clean the sample for slurry residues left by the CMP.
The user manual, user APV, technical information and contact information can be found in LabManager:
The Logitech Orbis (CMP) in LabManager
Equipment | Polisher/Lapper | |
---|---|---|
Purpose |
Polishing of |
|
Performance | 20x20mm substrate |
|
100mm substrate |
| |
Process parameter range | Polishing liquid |
|
Polishing cloths |
| |
Rotation |
| |
Arm sweep |
| |
Substrates | Sample size |
|
Allowed materials |
|