Specific Process Knowledge/Characterization/XPS/NexsaOverview

Overview of the processing options on the XPS Nexsa

The acquisition of an instrument like the Nexsa has to be done through a EU tender process. As a somewhat unexpected result of this process, we were offered the Nexsa at a very favorable price. We were therefore able to squeeze all but one of the available options into the budget. That is, of course, very nice indeed, but it also means that we will have to investigate the applications of the various techniques as there is no applications waiting for a specific technique to become available.

We have therefore compiled the table below that contains articles and application notes in which several of the available techniques are used

The columns contain the following information (excluded are the columns where the content is evident):

• Title: Click on the title to access a pdf version of the article/application note.
• Web of Science: Click here to access the article in the Web of Science database (log on to WoS via DTU Inside in advance, click this link ). This will enable you to browse the cited references and citations of the article.
• Abstract: Hover the mouse over the text to show the abstract of the article.

Publication				Techniques and hardware applied						Sample types/Materials	Abstract: Hover cursor to show
Title (The link requires login)	Type	Author	Link	XPS	UPS	ISS	REELS	Raman	Additional options/hardware
Multitechnique Surface Characterization of Organic LED Material	Application note	P Mack	link	x	x		x			Organic LED's	Abstract
Advantages of coincident XPS-Raman in the analysis of mineral oxides species	Application note	Thermofisher Scientific	link	x				x		TiO2, CaCO3	Abstract
Spectroscopic analysis of solid oxide fuel cell material with XPS	Application note	P Mack	link	x							Abstract
Rapid XPS image acquisition using SnapMap	Application note	R Simpson	link						SnapMap		Abstract
Composition, coverage and band gap analysis of ALD-grown ultra thin films	Application note	P Mack	link						Band gap	Gate dielectrics, HfO2, SiO2	Abstract
Confirming the layer structure of an organic FET device	Application note	P Mack	link						MAGCIS	Organic FET's	Abstract
				X						,
Surface analysis of zeolites: An XPS, variable kinetic energy XPS, and low energy ion scattering study	Publication	SR Bare	link	x		x				Zeolites, Metal oxides	Abstract
Surface composition analysis by low-energy ion scattering	Publication, background	H H Brongersma	link			x					Abstract
Diffusion of In0.53Ga0.47As elements through hafnium oxide during post deposition annealing	Publication	W Cabrera	link	x		x			TEM	HfO2, InGaAs, ALD	Abstract
Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications	Publication, review	C V Cushman	link			x					Abstract
HfO2 on MoS2 by Atomic Layer Deposition: Adsorption Mechanisms and Thickness Scalability	Publication	S McDonnell	link			x			AFM, ALD	HfO2, MoS2	Abstract
Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS	Publication	S Prusa	link			x				Graphene	Abstract
Reflection electron energy loss spectroscopy for ultrathin gate oxide materials	Publication	H C Shin	link	x			x		Valence band	HfZrO4	Abstract
Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions	Publication	R Steinberger	link	x		x			AES, ARXPS, sputter profiles	Oxygen on metal surfaces	Abstract
Electrochemical Characterization and Quantified Surface Termination Obtained by Low Energy Ion Scattering and X-ray Photoelectron Spectroscopy of Orthorhombic and Rhombohedral LaMnO3 Powders	Publication	E Symianakis	link	x		x			XRD	Catalysts, LaMnO3	Abstract
The Thermal Oxidation of TiAlN High Power Pulsed Magnetron Sputtering Hard Coatings as Revealed by Combined Ion and Electron Spectroscopy	Publication	M Wiesing	[ link]	x	x	x			Ar sputtering	TiAlN	Abstract
Electronic structure and energy band gap of poly(9,9-dioctylfluorene) investigated by photoelectron spectroscopy	Publication	L. S. Liao	link	x			x			Polymer	Abstract
Electronic and optical properties of hafnium indium zinc oxide thin film by XPS and REELS	Publication	Y. R. Denny	link	x			x				Abstract

Please don't hesitate to contact us if you find a relevant article to include in the table. Or if any of the articles listed is not suitable.