Specific Process Knowledge/Etch/ASE (Advanced Silicon Etch): Difference between revisions

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!style="background:silver; color:black;" align="left"|Purpose  
!style="background:silver; color:black;" align="left"|Purpose  
|style="background:LightGrey; color:black"|Dry etch of ||style="background:WhiteSmoke; color:black"|
|style="background:LightGrey; color:black"|Dry etch of  
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*Silicon
*Silicon
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!style="background:silver; color:black" align="left"|Performance
!style="background:silver; color:black" align="left" valign="top" rowspan="2"|Performance
|style="background:LightGrey; color:black"|Etch rates||style="background:WhiteSmoke; color:black"|
|style="background:LightGrey; color:black"|Etch rates
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*Silicon: ~4-6 µm/min (depending on features size and etch load)
*Silicon: ~4-6 µm/min (depending on features size and etch load)
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|style="background:silver; color:black" |.||style="background:LightGrey; color:black"|Anisotropy||style="background:WhiteSmoke; color:black"|
|style="background:LightGrey; color:black"|Anisotropy
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*Good  
*Good  
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!style="background:silver; color:black" align="left"|Process parameter range
!style="background:silver; color:black" align="left" valign="top" rowspan="2"|Process parameter range
|style="background:LightGrey; color:black"|Process pressure||style="background:WhiteSmoke; color:black"|
|style="background:LightGrey; color:black"|Process pressure
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*~0.1-95 mTorr
*~0.1-95 mTorr
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|style="background:silver; color:black"|.||style="background:LightGrey; color:black"|Gas flows
|style="background:LightGrey; color:black"|Gas flows
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*SF<math>_6</math>: 0-600 sccm
*SF<math>_6</math>: 0-600 sccm
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*Ar: 0-100 sccm
*Ar: 0-100 sccm
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!style="background:silver; color:black" align="left"|Substrates
!style="background:silver; color:black" align="left" valign="top" rowspan="3"|Substrates
|style="background:LightGrey; color:black"|Batch size
|style="background:LightGrey; color:black"|Batch size
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*Or several smaller pieces on a carrier wafer
*Or several smaller pieces on a carrier wafer
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| style="background:LightGrey; color:black"|Substrate material allowed
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*Silicon wafers
*Silicon wafers
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*Quartz wafers  
*Quartz wafers  
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|style="background:silver; color:black"|.|| style="background:LightGrey; color:black"|Possible masking material
| style="background:LightGrey; color:black"|Possible masking material
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*Photoresist/e-beam resist
*Photoresist/e-beam resist

Revision as of 16:10, 7 May 2008

The ASE

The ICP-DRIE tool at Danchip: STS ASE - positioned in cleanroom2

The ICP-DRIE (Inductively Coupled Plasma - Deep Reactive Ion Etcher) tool at Danchip is manufactured by STS and is called the ASE (Advanced Silicon Etcher). The main purpose of the ASE is etching of silicon using Bosch process.

The Bosch process: Etching of silicon

The Bosch process uses alternation between an etch cycle and a passivation cycle. Introducing a passivation step in an etch process is very beneficial for the control of the angle of the sidewalls in the etch process because it allows us to cover them with a protective layer that suppresses the isotropic etching. Combined with the high plasma density in the ICP chamber, the excellent sidewall control enables us to etch high aspect ratio structures in silicon with very high etch rates.

In the case of the silicon etching on the ASE, an etch phase with SF6 and O2 alternates with a passivation phase with C4F8.


An overview of the performance of the ASE and some process related parameters

Purpose Dry etch of
  • Silicon
Performance Etch rates
  • Silicon: ~4-6 µm/min (depending on features size and etch load)
Anisotropy
  • Good
Process parameter range Process pressure
  • ~0.1-95 mTorr
Gas flows
  • SF: 0-600 sccm
  • O: 0-100 sccm
  • CF: 0-300 sccm
  • Ar: 0-100 sccm
Substrates Batch size
  • 1 6" wafer per run
  • 1 4" wafer per run
  • 1 2" wafer per run
  • Or several smaller pieces on a carrier wafer
Substrate material allowed
  • Silicon wafers
    • with layers of silicon oxide or silicon (oxy)nitride
  • Quartz wafers
Possible masking material
  • Photoresist/e-beam resist
  • PolySilicon
  • Silicon oxide or silicon (oxy)nitride
  • Aluminium