Specific Process Knowledge/Lithography/Coaters

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Coater Comparison Table

Equipment Spin Coater: Gamma UV Spin Coater: Süss Stepper Spin Coater: Gamma E-beam and UV Spin Coater: RCD8 Spin Coater: LabSpin 02 Spin Coater: LabSpin 03 Spray Coater
Purpose
  • In-line substrate HMDS priming
  • Coating and baking of
    • AZ MiR 701 (29cps)
    • AZ nLOF 2020
    • AZ 5214E
  • Coating and baking of
    • BARC (DUV42S-6)
    • KRF M230Y
    • KRF M35G
    • UVN2300-0.8
  • In-line substrate HMDS priming
  • Coating and baking of
    • AR-P 6200 (CSAR)
    • AZ 5214E
    • AZ MiR 701 (29cps)
    • AZ 4562
  • Edge bead removal on novolac-based resist and SU-8
  • Coating of
    • SU-8
    • AZ 5214E
    • AZ 4562
    • AZ MiR
    • AZ nLOF
  • Edge bead removal
  • Coating of E-beam resists
    • CSAR, ZEP, PMMA/MMA, HSQ(FOx)
  • Coating of UV resists
    • AZ5214E, AZ4562, AZMiR701, AZnLOF, SU-8
  • Coating of imprint resists
  • Spraying imprint resist
  • Spraying photoresist
  • Spraying of other solutions
Performance Substrate handling
  • Cassette-to-cassette
  • Vacuum handling and detection
  • Vacuum spin chuck
  • Cassette-to-cassette
  • Vacuum handling and detection
  • Vacuum spin chuck
  • Cassette-to-cassette
  • Vacuum handling and detection
  • Vacuum spin chuck
  • Single substrate
  • Vacuum chuck for 4" and 6"
  • 4" non-vacuum chuck for fragile substrates
  • Single substrate
  • Vacuum chucks for chips, 2", 4", and 6"
  • 4" edge handling chuck

Can handle almost any sample size and shape

Permanent media
  • AZ MiR 701 (29cps) resist
  • AZ nLOF 2020 resist
  • AZ 5214E resist
  • PGMEA solvent for backside rinse and spinner bowl cleaning
  • DUV42S-6 (BARC)
  • KRF M230Y resist
  • KRF M35G resist
  • AR-P 6200.09 (CSAR) for 2", 4", and 6"
  • AZ5214E for 2", 4", and 6"
  • AZ MiR 701 (29cps) for 4", and 6"
  • AZ4562 for 4", and 6"
  • PGMEA solvent for edge bead removal, backside rinse, and spinner bowl cleaning

No permanent media

Only manual dispense

No permanent media

Manual dispense option
  • no manual dispense
  • syringe dispense (60cc) of PGMEA-based resist
  • no manual dispense
  • syringe dispense (60cc) of PGMEA and anisole-based resist
  • no manual dispense
  • syringe dispense (30cc) of PGMEA and anisole-based resist (2" only)
  • yes
  • pneumatic dispense for SU-8 resist and EBR solvent
Only manual dispense

Two syringe pumps

Process parameter range Spindle speed

10 - 6000 rpm

10 - 6000 rpm

10 - 6000 rpm

10 - 5000 rpm (3000 rpm with non-vacuum chuck)

100 - 5000 rpm (3000 rpm with edge handling chuck)

Gyrset

no

no

no

optional (max. speed 3000 rpm)

no

Substrates Substrate size
  • 50 mm wafers (tool change required)
  • 100 mm wafers
  • 150 mm wafers
  • 200 mm wafers (tool change required)
  • 100 mm wafers
  • 150 mm wafers
  • 200 mm wafers (may require tool change)
  • 2" or 50 mm wafers
  • 100 mm wafers
  • 150 mm wafers
  • 100 mm wafer
  • 150 mm wafer
  • 50 mm wafers
  • 100 mm wafers
  • 150 mm wafer
  • small pieces down to 10x10 mm2

Any sample(s) that fit inside machine

Batch size

1 - 25

1 - 25

1 - 25

1

1

1

Allowed materials
  • Silicon
  • Glass

No resist or crystalbond allowed in the HMDS module

  • Silicon
  • Glass
  • Silicon
  • III-V materials
  • Glass

No resist or crystalbond allowed in the HMDS module

All cleanroom materials except III-V materials

  • Silicon
  • III-V materials
  • Glass
  • All chemicals to be spray coated must be approved specifically for spray coating
  • Any non-toxic, non-particulate and non-crosslinking material is likely to be approved


Spin coating

The typical spin coating process consists of the following steps:

  1. Priming (typically HMDS)
  2. Resist dispense (static or dynamic)
    • Optional: Acceleration to a low spin speed if dynamic dispense is used
    • Optional: Resist spreading at low spin speed
  3. Spin-off
  4. Backside rinse (typically during spin-off)
  5. Optional: Edge-bead removal
  6. Softbake (contact or proximity)


After priming, the wafer is is transferred to the spin coater. If static dispense is used, the wafer remains static during the resist dispense. In the case of dynamic dispense, the wafer rotates at low spin speed during the dispense. Using too high spin speed during dispense can cause surface wetting issues, while a too low spin speed causes the resist to flow onto the backside of the wafer. After dispense, a short spin at low spin speed may be used in order to spread the resist over the wafer surface before spin-off.

Spin-off

The spin-off cycle determines the thickness of the resist coating. For a given resist, the thickness is primarily a function of the spin-off speed and the spin-off time, both following an inverse power-law:

The acceleration to the spin-off speed also influences the thickness, but the effect is dependent on previous steps. The spin-off is usually a simple spin at one speed, but it may be comprised of several steps at different spin speeds. After spin-off, the wafer is decelerated.

The coated thickness, , as a function of the spin-off speed, , follows an inverse power-law:

The constant, , is a function of the resist viscosity and solid content, as well as the spin-off time. The exponent, , is dependent on solvent evaporation, and is typically ~½ for UV resists. This means that from the thickness achieved at spin speed , one can estimate the spin speed needed to achieve thickness using the relation:


For thick SU-8, however, is observed to be ~1 (probably due to the low solvent content and/or the formation of skin). In this case, the relation simply becomes:

Backside rinse

If the spin speed is too low during resist dispense, resist may creep over the edge of the wafer and onto the backside. Some resist tend to leave fine strings of resist protruding from the edge of the wafer, or folded onto the backside, an effect sometimes referred to as "cotton candy".

Any resist on the edge and backside of the wafer will contaminate the end effector, softbake hotplate, and subsequent wafers.

In a backside rinse step, solvent administered through a nozzle to the backside of the wafer, while spinning at low or medium spin speed, dissolves the resist and washes it away. After the rinse, a short spin at medium spin speed dries the wafer before the softbake.

During the backside rinse solvent inevitably creeps onto the front side of the wafer. This effect may be used to dissolve and subsequently remove an edge-bead, but it may also leave the rim of the wafer exposed. As an alternative to backside rinse, a wafer, which is contaminated on the backside, may be softbaked in proximity, in order to protect the hotplate from contamination. This leaves front side coating intact, but also leaves the backside dirty.

Edge bead

During spin coating, resist builds up at the edge of the wafer due to the change in surface tension at the edge, as well as extra drying from turbulence created by the wafer edge.

This phenomenon is called edge-bead. Dependent on spin coating parameters, the coating may be several times thicker at the edge than in the central area. In a subsequent hard contact exposure step (mask aligner), this edge-bead introduces an undesired proximity gap, which reduces the lateral resolution, and may even cause the wafer to stick to the mask.

In an edge-bead removal step, solvent administered through a nozzle positioned at the edge of the wafer, while spinning at low or medium spin speed, dissolves the resist and washes it away. After the removal, a short spin at medium spin speed dries the wafer before the softbake. Dependent on the viscosity (solvent content) of the resist after the edge-bead removal, this drying spin may cause the resist to re-flow and create a secondary edge-bead. In some cases, it may be necessary to (partially) softbake the resist before edge-bead removal.

Softbake

After spin coating, the solvent in the resist must be evaporated in a baking step, in order to solidify the resist. This softbake can be carried out as a contact bake or a proximity bake. In a contact bake, the wafer is held in close contact to the hotplate surface while resting on shallow bumps only 150 µm above the hotplate. In a proximity bake, the wafer is first moved into proximity, e.g. 1mm, of the hotplate surface, then held there (on the lift pins) for the duration of the bake.

Spin coaters at DTU Nanolab

Spin Coater: Gamma UV

Spin Coater: Gamma UV in E-5

Spin Coater: Gamma UV was installed at DTU Nanolab in March 2015. It is a Gamma 2M cluster from Süss MicroTec with spin coating, HMDS vapour priming, and baking modules.

The system handles 4" and 6" wafers without size conversion, and can be set up to handle 2" or 8".

The coater is equipped with 3 different resist lines, as well as 1 syringe line:

  • AZ MiR 701
  • AZ nLOF 2020
  • AZ 5214E
  • Syringe, which can be used for various resists

The processes that are available on the system are developed by Nanolab. Upon request, it is possible to establish new processes. Use of the syringe requires special training, and would as a starting point require batches in excess of 20 wafers.

Training video

The user manual, quality control procedures and results, user APVs, and contact information can be found in LabManager - requires login

Process information

Equipment performance and process related parameters

Purpose
  • HMDS priming
  • Spin coating of PGMEA based UV resists
  • Spin coating of E-beam resists 1)
  • Soft baking
Resist
  • AZ MiR 701 (29cps)
  • AZ nLOF 2020
  • AZ 5214E
  • 60cc syringe dispense
Performance HMDS contact angle

  60 - 80°

Coating thickness
  • AZ MiR 701: 1.5-4 µm
  • AZ nLOF 2020: 1.5-5 µm
  • AZ 5214E: 1.5-5 µm
  • AZ 4562: 5-15 µm
Process parameters Priming temperature

  120 °C

Spin speed

  10 - 6000 rpm

Spin acceleration

  10 - 10000 rpm/s

Hotplate temperature

  25 - 200 °C

Cool plate temperature

  21 °C

Substrates Substrate size
  • 50 mm wafers 1)
  • 100 mm wafers
  • 150 mm wafers
  • 200 mm wafers 1)
Allowed materials

Silicon and glass

Resists and crystalbond are not allowed in the HMDS module

Batch

  1 - 25

1) Requires tool change.

Spin coater: Süss stepper

The SÜSS Spinner-Stepper is placed in F-3

This spinner is dedicated for spinning DUV resists. The spinner is fully automatic and can run up to 25 substrates in a batch 4", 6", and 8" size (8" requires tool change). The machine is equipped with the 3 resist lines (DUV42S-6, KRF M230Y, and KRF M35G), as well as a syringe dispense system.

The user manual, quality control procedures and results, user APVs, and contact information can be found in LabManager:

Equipment info in LabManager - requires login

DUV resist overview

The spinning process will be performed by the customer together with the Photolith group of Nanolab. In case you would like to do DUV lithography please contact Lithography team, who will consult you and run your wafers together with you.


Bottom Anti Reflection Coating (BARC):


Positive DUV resist for spin coating in 600-300nm thickness range:


Positive DUV resist for spin coating in 1600-800nm thickness range:


Negative DUV resist for spin coating in 1400-800nm or diluted with EC Solvent in 1:1 in 400-200nm thickness range:

Process information

Equipment performance and process related parameters

Purpose
  • Spin coating and soft baking of BARC
  • Spin coating and soft baking of DUV resists
  • Post exposure baking
Resist
  • BARC DUV42S-6
  • Positive tone resist KRF M230Y
  • Positive tone resist KRF M35G
  • Negative tone resist UVN2300-0.8
Performance Coating thickness
  • BARC DUV42S-6 60-90nm
  • Positive tone resist KRF M230Y 300-600nm
  • Positive tone resist KRF M35G 800-1600nm
  • Negative tone resist UVN2300-0.8 200-1400nm
Process parameters Spin speed

  10 - 5000 rpm

Spin acceleration

  100 - 10000 rpm/s

Hotplate temperature
  • 175°C for BARC baking
  • 130°C for positive tone resist soft baking and post exposure baking
  • 100°C for negative tone resist soft baking and post exposure baking
Substrates Substrate size
  • 100 mm wafers
  • 150 mm wafers
  • 200 mm wafers (requires tool change)
Allowed materials
  • Any standard cleanroom material
Batch

  1 - 25


Spin Coater: Gamma E-beam and UV

Spin Coater: Gamma E-beam & UV in E-5

Spin Coater: Gamma E-beam and UV was installed at DTU Nanolab in June 2017. It is a Gamma 4M cluster from Süss MicroTec with spin coating, HMDS vapour priming, and baking modules. The system handles 2", 4", and 6" wafers without size conversion, using two separate coater stations.

The 2" coater station is equipped with 1 resist line, as well as 1 syringe line:

  • AR-P 6200.09 (CSAR)
  • Syringe, which can be used for various resists (anisole-based or PGMEA-based). We currently recommend against using the syringe, as the process setup is quite demanding. Use a manual spin coater instead.


The 4"/6" coater station is equipped with 4 different resists lines:

  • AZ 5214E
  • AZ MiR 701
  • AR-P 6200.09 (CSAR)
  • AZ 4562

The processes that are available on the system are developed by Nanolab. Upon request, it is possible to establish new processes. Use of the syringe requires special training, and requires batch processing - it is not for processing a few wafers now and then.

Training video

The user manual, quality control procedures and results, user APVs, and contact information can be found in LabManager - requires login

Process information

Equipment performance and process related parameters

Purpose
  • HMDS priming
  • Spin coating of anisole based E-beam resists
  • Spin coating of PGMEA based UV resists
  • Soft baking
  • Edge bead removal (CSAR and novolac-based UV resists)
Resist
  • AR-P 6200.09 (CSAR)
  • AZ 5214E
  • AZ MiR 701 (29cps)
  • AZ 4562
  • 30cc syringe dispense
Performance HMDS contact angle

  60 - 80° (on Silicon)

Coating thickness
  • AR-P 6200.09 (CSAR): 170-500 nm
  • AZ 5214E: 1.5-5 µm
  • AZ MiR 701: 1.5-4 µm
  • AZ 4562: 5-25 µm
Process parameters Priming temperature

  120 °C

Spin speed

  10 - 6000 rpm

Spin acceleration

  10 - 10000 rpm/s

Hotplate temperature

  25 - 200 °C

Cool plate temperature

  21 °C

Substrates Substrate size
  • 50 mm wafers
  • 100 mm wafers
  • 150 mm wafers
Allowed materials

  Silicon, III-V, and glass

  Resists and crystalbond are not allowed in the HMDS module

Batch

  1 - 25


Spin Coater: RCD8

Spin coater: RCD8 is located in C-1

Spin Coater: RCD8 is a model RCD8 T spin coater from Süss MicroTec with a motorized media arm and Gyrset functionality. It's primary purpose is spin coating of SU-8 resist.

However, due to the possibility of using a non-vacuum chuck, the spin coater is also suitable for coating of substrates with e.g. textured backsides or membranes.

The user manual, user APV, and contact information can be found in LabManager - requires login

Process information

Equipment performance and process related parameters

Purpose
  • Spin coating of SU-8 resists
  • Spin coating of PGMEA based AZ resists
  • Spin coating of wafers with structured backside
  • Edge bead removal
Resist
  • manual dispense
  • automatic dispense from syringe
Performance Coating thickness
  • SU-8 resits: 0.1-200+ µm
  • AZ 5214E: 1.5-3 µm
  • AZ 4562: 8-15 µm
  • AZ MiR 701: 1.5-3 µm
  • AZ nLOF 2020: 2-3.5 µm
Process parameters Spin speed

Vacuum chuck: 10 - 5000 rpm
Non-vacuum chuck: Max. 3000 rpm

Spin acceleration

10 - 3000 rpm/s
Max. 1500 rpm/s with Gyrset

Substrates Substrate size
  • 100 mm wafers
  • 150 mm wafers (vacuum chuck only)
Allowed materials

All cleanroom materials ?

Batch

1


Spin coater: Labspin

Labspin 2.JPG Labspin 3 + fumehood 11.JPG
Spin Coater: Labspin 02 Spin Coater: Labspin 03 + fumehood 11
Loacted in wetbench 08 in E-5 Located in wetbench 09 in E-5
LabSpin 6, Süss MicroTec LabSpin 6, Süss MicroTec


Training video: LabSpin02 + 03

Process information

Spin curves (LabSpin 6):

More information on resists (incl. spin curves) is available in the resist overview.

Available bowlsets:

Bowlset name Component solvent Cleaning solvent List of resists Comments
AZ resist PGMEA/Ethyl Lactate Acetone

AZ 5214E
AZ 4562
AZ MiR 701
AZ nLOF 2000 series
mr-I8100R

Two bowlsets available
CSAR/ZEP/mrEBL/PMMA Anisole Remover 1165

AR-P 6200 series (CSAR 62)
ZEP520A
mr EBL 6000
PMMA (in anisole)
UV5
mr-T85L
XNIL26
mri8000
mr-I 7010E
mr-XNIL26_SF
mrNIL210

HSQ/AR-N 8200 MIBK/PGMEA Acetone

HSQ (FOx series)
AR-N 8200

OrmoComp/OrmoStamp Propyl Acetate Acetone

OrmoComp
OrmoStamp
OrmoPrime
OrmoClad
Inkron
mr-I-7030R
mr-I 8020E
mr-I-7010E
mrNIL210
mr-I 8500E
mr-T85
MRT HI01XP
Protek B3
mrUVCur21
mr-I 8100E_XP
mrNIL210
MRT HI01XP
mr-NIL 6000.3E
mr-I 8100R_XP

BCB/CYCLOTENE Mesitylene T1100

3022-X
4022-X

Epoxy/Acrylate Cyclopentanone/PGMEA Acetone

SU-8 2000 series
mr-DWL
LOR (1A, 3A, 5A)
mr-i 8030e
mr-NIL200
DELO-PRE/OM4310
OrmoStamp
Inkron
mr-I 8020E
OM4310

AR-P 617/AR-N 7520 PGME/PGMEA Acetone AR-N 7500 series
Polymer Ps-b-PDMS/block copolymer Heptane Ethyl Acetate
DIRTY bowlset Anything Organic Use the appropriate cleaning reagent for your resist


Equipment performance and process related parameters

Purpose Labspin

Spin coating of resist ONLY in dedicated bowlsets

Please do NOT use substances which is not for the dedicated bowlsets

All purpose

Spin coating of dirty substances in All purpose

Process parameters Spin speed
  • Vacuum chuck: 100 - 8000 rpm
  • Edge handling chuck: Max. 3000 rpm
Spin acceleration
  • 200 - 4000 rpm/s
Substrates Substrate size
  • Chips 5x5 mm and up
  • 50 mm wafers
  • 100 mm wafers
  • 150 mm wafers
Allowed materials

All cleanroom materials

Please ONLY use substances which is for the dedicated bowlsets in labspins

Batch

1


Spray Coater

Spray Coater in Cleanroom C-1

The spray coater at DTU Nanolab is located in Cleanroom C-1. The machine is an ExactaCoat from Sono-tek which can be fitted with one of three different nozzles depending on the nature of the spray coating tasks at hand. The three different nozzles (Impact, AccuMist and Vortex) are optimized for different applications such as spray coating of large areas (e.g. entire wafers), smaller areas (e.g. wafer pieces or other small samples) or already structured samples that cannot be coated uniformly by spin coating. All nozzles use an ultrasonic tranducer for atomizing the solution to be spray coated. It is therefore a prerequisite that all components are compatible with this process. This is the case with most substances, although process parameters may need optimization to give satisfactory results.

Practically any sample that will fit inside the spray coater can be processed. Spray patterns are easily programmed either using predefined spray patterns (1D line, 2D rectangles/circles/meanders/spirals) or custom 3D spray patterns.

The spray coating process as well as major features of the three nozzles are described into more detail in the manual which can be found via the Equipment Info page in LabManager under the Documents sections. The manual can also be found in Labmanager - requires login


Further information about the spray coater (manual, process log, technical information etc.) can be found in LabManger:

Spray coater in LabManager - requires login


Process development

Spray coating using TI spray:
The TI spray resist is the standard spray coater resist used at DTU Nanolab. It requires no dilution and performs well.


Spray coating using other resists:
Other resists are allowed, but most require dilution, as the spray coater will not work with any resist viscosity higher than 20 cP.


Equipment performance and process related parameters

Equipment Spray Coater
Purpose
  • Spraying imprint resists (primarily mr-NIL 6000E and mr-I 8000E)
  • Spraying photoresist (primarily AZ-4562)
  • Spraying of other solutions
Performance Substrate handling
  • Can handle almost any sample size and shape (although no automatic handling)
Permanent media
  • No permanent media
Manual dispense option
  • Two syringe pumps
Process parameter range Solution viscosity
  • Should not exceed 20 cP
Chemical properties
  • Must be non-toxic
  • Must be compatible with titanium
  • Resistant to ultrasonic sonication
Substrates Batch size
  • Any sample(s) size and number that fit inside machine
Allowed materials
  • All chemicals to be spray coated must be approved specifically for spray coating
  • Most non-toxic, non-particulate and non-crosslinking material likely to be approved
  • Suspensions challenging due to very low diameter tubing