LabAdviser/314/Microscopy 314-307: Difference between revisions

From LabAdviser
Jump to navigation Jump to search
No edit summary
 
(3 intermediate revisions by the same user not shown)
Line 2: Line 2:
<!-- <span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] -->
<!-- <span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] -->


''This section is written by DTU Nanolab internal if nothing else is stated.''
[[Category:314]]
[[Category:314]]
[[Category:314-Microscopy]]
[[Category:314-Microscopy]]
Line 15: Line 16:
| align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy-icon_TEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/TEM|TEM ]]
| align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy-icon_TEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/TEM|TEM ]]
| align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM|SEM ]]
| align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM|SEM ]]
| align="center" width="200px" | '''Dual-beam Electron Microscopy - FIB-SEM and PFIB-SEM''' [[image:Microscopy-icon.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB|FIB ]]
| align="center" width="200px" | '''Dual-beam Electron Microscopy - FIB-SEM and PFIB-SEM''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB|FIB ]]
|}
|}


Line 24: Line 25:
{| border="0" cellspacing="75" style="margin: auto;"
{| border="0" cellspacing="75" style="margin: auto;"
|+
|+
| align="center" width="200px" heigth="250px" | '''X-Ray spectroscopy (EDS/WDS)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy 314-307/Technique/X-ray_spectroscopy|EDS/WDS ]]
| align="center" width="200px" heigth="250px" | '''X-Ray spectroscopy (EDS/WDS)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy 314-307/Technique/X-ray_spectroscopy|EDS/WDS ]]
| align="center" width="200px" | '''Electron Energy Loss Spectroscopy (EELS)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/Technique/EELS|EELS ]]
| align="center" width="200px" | '''Electron Energy Loss Spectroscopy (EELS)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/EELS|EELS ]]
| align="center" width="200px" | '''Energy Filtered TEM (EFTEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy 314-307/Technique/EFTEM|EFTEM ]]
| align="center" width="200px" | '''Energy Filtered TEM (EFTEM)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy 314-307/Technique/EFTEM|EFTEM ]]
|+
|+
<!-- | align="center" width="200px" | '''Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/Technique/EBSD-TKD|EBSD/TKD ]] -->
<!-- | align="center" width="200px" | '''Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/EBSD-TKD|EBSD/TKD ]] -->
| align="center" width="200px" | '''Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/SEM/Nova/Transmission Kikuchi diffraction|EBSD/TKD ]]
| align="center" width="200px" | '''Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM/Nova/Transmission Kikuchi diffraction|EBSD/TKD ]]


| align="center" width="200px" | '''Electron Holography''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/Technique/Holo|Holography ]]
| align="center" width="200px" | '''Electron Holography''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/Holo|Holography ]]
| align="center" width="200px" | '''Diffraction''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/Technique/Diffraction|Diffraction ]]
| align="center" width="200px" | '''Diffraction''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/Diffraction|Diffraction ]]
|}
|}


Line 39: Line 40:
{| border="0" cellspacing="75" style="margin: auto;"
{| border="0" cellspacing="75" style="margin: auto;"
|+
|+
| align="center" width="200px" heigth="250px" | '''Available software at DTU Nanolab''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/Postprocessing|Available software ]]
| align="center" width="200px" heigth="250px" | '''Available software at DTU Nanolab''' [[image:Data_measure.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Postprocessing|Available software ]]
| align="center" width="200px" heigth="250px" | '''Lattice fringe analysis''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/Postprocessing/Lattice fringes|Lattice fringes ]]
| align="center" width="200px" heigth="250px" | '''Lattice fringe analysis''' [[image:Data_statistic.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Postprocessing/Lattice fringes|Lattice fringes ]]
| align="center" width="200px" heigth="250px" | '''Remote Access for Staff''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/Postprocessing/Remote_access|Remote access to the microscopes for DTU Nanolab staff ]]
| align="center" width="200px" heigth="250px" | '''Remote Access for Staff''' [[image:Data_laptop.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Postprocessing/Remote_access|Remote access to the microscopes for DTU Nanolab staff ]]
|}
|}

Latest revision as of 10:09, 27 June 2023

Feedback to this page: click here

This section is written by DTU Nanolab internal if nothing else is stated.

Electron Microscopy at DTU Nanolab building 314/307

What kind of microscopes are available?

At DTU Nanolab - building 314/307 are different types of microscopes available:

Transmission Electron Microscopy (TEM) TEM Scanning Electron Microscopy (SEM) SEM Dual-beam Electron Microscopy - FIB-SEM and PFIB-SEM FIB

Which techniques are available?

Depending on the equipment, different techniques are available:

X-Ray spectroscopy (EDS/WDS) EDS/WDS Electron Energy Loss Spectroscopy (EELS) EELS Energy Filtered TEM (EFTEM) EFTEM
Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD) EBSD/TKD Electron Holography Holography Diffraction Diffraction

What to do with the data?

Available software at DTU Nanolab Available software Lattice fringe analysis Lattice fringes Remote Access for Staff Remote access to the microscopes for DTU Nanolab staff
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=LabAdviser/314/Microscopy_314-307&oldid=46653"