Specific Process Knowledge/Thin film deposition/Deposition of Silicon Nitride
Feedback to this page: click here
Deposition of silicon nitride
Deposition of silicon nitride can be done with either LPCVD (Low Pressure Chemical Vapor Deposition) or PECVD (Plasma Enhanced Chemical Vapor Deposition). Stiochiometric nitride or silicon rich (low stress) LPCVD nitride is deposited on a batch of wafers in a LPCVD nitride furnace, and PECVD nitride (or oxynitride) is deposited on a few samples at a time in a PECVD system. LPCVD nitride has a good step coverage and a very good uniformity. Using PECVD it is possible to deposit a thicker layer of nitride on different types of samples, but the nitride does not cover sidewalls very well.
It is also possible to deposit silicon nitride using the Lesker sputter system. However, the process hasnot been tested yet, but the required sputter targets for nitride deposition are avaliable.
- Nitride deposition using PECVD] (or oxynitride)
Comparison of LPCVD and PECVD for silicon nitride deposition
LPCVD | PECVD | |
---|---|---|
Generel description | Low Pressure Chemical Vapour Deposition (LPCVD furnace process) | Plasma Enhanced Chemical Vapour Deposition (PECVD process) |
Stoichiometry |
Si3N4: Stoichiometric nitride SRN: Silicon rich (low stress) nitride |
Silicon nitride can be doped with boron, phosphorus or germanium |
Film thickness |
Thicker nitride layers can be deposited over more runs |
|
Process temperature |
|
|
Step coverage |
|
|
Film quality |
|
|
KOH etch rate (80 oC) |
|
|
BHF etch rate |
|
|
Batch size |
Depending on what furnace you use |
Depending on what PECVD you use |
Allowed materials |
Processed wafers have to be RCA cleaned |
|