Specific Process Knowledge/Thin film deposition/Deposition of Silicon Nitride: Difference between revisions

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![[Specific Process Knowledge/Thin film deposition/Lesker|Lesker sputter system]]
![[Specific Process Knowledge/Thin film deposition/Lesker|Lesker sputter system]]

Revision as of 11:54, 28 January 2014

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Deposition of silicon nitride

Deposition of silicon nitride can be done with either LPCVD (Low Pressure Chemical Vapor Deposition) or PECVD (Plasma Enhanced Chemical Vapor Deposition). Stiochiometric nitride or silicon rich (low stress) LPCVD nitride is deposited on a batch of wafers in a LPCVD nitride furnace, and PECVD nitride (or oxynitride) is deposited on a few samples at a time in a PECVD system. LPCVD nitride has a good step coverage and a very good uniformity. Using PECVD it is possible to deposit a thicker layer of nitride on different types of samples, but the nitride does not cover sidewalls very well.

It is also possible to deposit silicon nitride using the Lesker sputter system. However, the process hasnot been tested yet, but the required sputter targets for nitride deposition are avaliable.

Comparison of LPCVD, PECVD and Lesker sputter system for silicon nitride deposition

LPCVD PECVD Lesker sputter system
Generel description Low Pressure Chemical Vapour Deposition (LPCVD furnace process) Plasma Enhanced Chemical Vapour Deposition (PECVD process)
Stoichiometry
  • Si3N4
  • SRN (only 4" nitride furnace)

Si3N4: Stoichiometric nitride

SRN: Silicon rich (low stress) nitride

  • SixNyHz
  • SixOyNzHv

Silicon nitride can be doped with boron, phosphorus or germanium

Film thickness
  • Si3N4: ~50 Å - ~1400 Å
  • SRN: ~50 Å - ~2800 Å

Thicker nitride layers can be deposited over more runs

  • ~40 nm - 10 µm
Process temperature
  • 780 oC - 845 oC
  • 300 oC
Step coverage
  • Good
  • Less good
Film quality
  • Deposition on both sides og the substrate
  • Dense film
  • Few defects
  • Deposition on one side of the substrate
  • Less dense film
  • Incorporation of hydrogen in the film
KOH etch rate (80 oC)
  • Expected <1 Å/min
  • Dependent on recipe: ~1-10 Å/min
BHF etch rate
  • Very low

(Stoichiometric nitride: ~0.75 nm/min. Morten Bo Mikkelsen, March 2013)

  • Very high compared the LPCVD nitride
Batch size
  • 1-25 100 mm wafers
  • 1-25 150 mm wafers (only 6" furnace)

Depending on what furnace you use

  • Several smaller samples
  • 1-several 50 mm wafers
  • 1-3 100 mm wafers
  • 1 150 mm wafer

Depending on what PECVD you use

Allowed materials
  • Silicon
  • Silicon oxide
  • Silicon nitride
  • Pure quartz (fused silica)

Processed wafers have to be RCA cleaned

  • Silicon
  • Silicon oxide (with boron, phosphorous and germanium)
  • Silicon nitrides (with boron, phosphorous and germanium)
  • Pure quartz (fused silica)