LabAdviser/CEN: Difference between revisions
| Line 18: | Line 18: | ||
*[[Specific Process Knowledge/Characterization/Tecnai TEM |Tecnai TEM]] | *[[Specific Process Knowledge/Characterization/Tecnai TEM |Tecnai TEM]] | ||
== | ==Ancillary Equipment== | ||
*[[/Sample Preparation|Sample Preparation Overview]] | *[[/Sample Preparation|Sample Preparation Overview]] | ||
*Optical microscopes | |||
*Ion milling | |||
*Pumping stations | |||
*Polishing | |||
*Saws | |||
==Post Processing== | ==Post Processing== | ||
*[[/Post Processing|Resources for Post Processing]] | *[[/Post Processing|Resources for Post Processing]] | ||
Revision as of 10:42, 8 December 2015
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SEM's
Dual Beam's
TEM's
Ancillary Equipment
- Optical microscopes
- Ion milling
- Pumping stations
- Polishing
- Saws