Latest revision as of 14:20, 16 March 2020

Feedback to this page: click here

This page gives an overview of the electron microscope equipment and other related resources connected to DTU Nanolab - building 307/314

SEM

Dual Beam

Helios NanoLAB 600

TEM

Ancillary Equipment

Plasma cleaner

Coaters

Sonicators

Hot plates

Plunger

Centrifuge

pH meter

Post Processing

Resources for Post Processing

@@ Line 1: / Line 1: @@
-=<span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]]=
+'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/LabAdviser/CEN click here]'''
+=This page gives an overview of the electron microscope equipment and other related resources connected to DTU Nanolab - building 307/314=
+==SEM==
+*[[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|SEM Comparison page - all of DTU Nanolabs SEMs]]
+*[[/Nova NanoSEM 600|Nova NanoSEM 600]]
+*[[/Quanta FEG 200 ESEM|QFEG 200 Cryo ESEM]]
+*[[/AFEG 250 Analytical SEM|AFEG 250 Analytical ESEM]]
+<!-- *[[/Inspect S|Inspect S]] -->
+==Dual Beam==
+<!-- *[[/Quanta 3D FIB/SEM|Quanta 3D FIB/SEM]] -->
+*[[/Helios Nanolab 600|Helios NanoLAB 600]]
+==TEM==
+*[[/Titan ATEM |Titan ATEM]]
+*[[/Titan ETEM |Titan ETEM]]
+*[[/Tecnai TEM |Tecnai T20 TEM]]
+*[[/Tecnai T12 Junior TEM |Tecnai T12 Junior TEM]]
+==Ancillary Equipment==
+*[[/Ancillary Equipment#Optical Microscopes|Optical microscopes]]
+*[[/Ancillary Equipment#Ion milling|Ion milling]]
+*[[/Ancillary Equipment#Pumping stations|Pumping stations]]
+*[[/Ancillary Equipment#Polishing|Polishing]]
+*[[/Ancillary Equipment#Saws|Saws]]
+*[[/Ancillary Equipment#Plasma cleaner|Plasma cleaner]]
-'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/LabAdviser/CEN click here]'''
+*[[/Ancillary Equipment#Coaters|Coaters]]
+*[[/Ancillary Equipment#Sonicators|Sonicators]]
-==SEM's==
+*[[/Ancillary Equipment#Hot plates|Hot plates]]
-*[[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|SEM Comparison page]]
-*[[Specific Process Knowledge/Characterization/SEM FEI QUANTA 200 3D|FIB-SEM FEI QUANTA 200 3D]]
-*[[Specific Process Knowledge/Characterization/Dual Beam FEI Helios Nanolab 600|Dual Beam FEI Helios Nanolab 600]]
-*[[Specific Process Knowledge/Characterization/SEM FEI Nova 600 NanoSEM|SEM FEI Nova 600 NanoSEM]]
-*[[Specific Process Knowledge/Characterization/SEM FEI Quanta 200 ESEM FEG|SEM FEI Quanta 200 ESEM FEG]]
-*[[Specific Process Knowledge/Characterization/SEM Inspect S|SEM Inspect S]]
-==SEM's==
+*[[/Ancillary Equipment#Plunger|Plunger]]
-*[[Specific Process Knowledge/Characterization/SEM FEI QUANTA 200 3D|FIB-SEM FEI QUANTA 200 3D]]
-*[[Specific Process Knowledge/Characterization/Dual Beam FEI Helios Nanolab 600|Dual Beam FEI Helios Nanolab 600]]
-==TEM's==
+*[[/Ancillary Equipment#Microtomes|Microtomes]]
-*[[Specific Process Knowledge/Characterization/Titan ATEM |Titan ATEM]]
+*[[/Ancillary Equipment#Critical point dryer|Critical point dryer]]
-*[[Specific Process Knowledge/Characterization/Titan ETEM |Titan ETEM]]
-*[[Specific Process Knowledge/Characterization/Tecnai TEM |Tecnai TEM]]
-==Sample Preparation==
+*[[/Ancillary Equipment#Centrifuge|Centrifuge]]
-*[[/Sample Preparation|Sample Preparation Overview]]
+*[[/Ancillary Equipment#pH meter|pH meter]]
 ==Post Processing==
 *[[/Post Processing|Resources for Post Processing]]