Specific Process Knowledge/Characterization/XPS/NexsaOverview - Revision history

Jmli at 09:38, 21 October 2025

2025-10-21T09:38:54Z

← Older revision		Revision as of 11:38, 21 October 2025
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			<!--Checked for updates on 21/10-2025. ok/ jmli-->

	== Overview of the processing options on the XPS Nexsa==		== Overview of the processing options on the XPS Nexsa==
	The acquisition of an instrument like the Nexsa has to be done through a EU tender process. As a somewhat unexpected result of this process, we were offered the Nexsa at a very favorable price. We were therefore able to squeeze <span title="The only analytical option (that means excluded chillers, factory training courses, UPS etc) not chosen is a vacuum transfer module " > ''all'' </span> but one of the available options into the budget. That is, of course, very nice indeed, but it also means that we will have to investigate the applications of the various techniques as there is no applications waiting for a specific technique to become available.		The acquisition of an instrument like the Nexsa has to be done through a EU tender process. As a somewhat unexpected result of this process, we were offered the Nexsa at a very favorable price. We were therefore able to squeeze <span title="The only analytical option (that means excluded chillers, factory training courses, UPS etc) not chosen is a vacuum transfer module " > ''all'' </span> but one of the available options into the budget. That is, of course, very nice indeed, but it also means that we will have to investigate the applications of the various techniques as there is no applications waiting for a specific technique to become available.

Jmli at 08:33, 1 February 2023

2023-02-01T08:33:43Z

← Older revision		Revision as of 10:33, 1 February 2023
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	\|docLink=https://assets.thermofisher.com/TFS-Assets/MSD/Application-Notes/AN52344-composition-coverage-band-gap-aanalysis-ald-grown-ultra-thin-films.pdf		\|docLink=https://assets.thermofisher.com/TFS-Assets/MSD/Application-Notes/AN52344-composition-coverage-band-gap-aanalysis-ald-grown-ultra-thin-films.pdf
	\|XPSused= \|UPSused= \|ISSused= \|REELSused= \|Ramanused=		\|XPSused= \|UPSused= \|ISSused= \|REELSused= \|Ramanused=
	\|AdditionalOption=		\|AdditionalOption=Band gap
	\|Sample=		\|Sample=Gate dielectrics, HfO<sub>2</sub>, SiO<sub>2</sub>
	\|Abstract=		\|Abstract=
	}}		}}
	\|-
	~~\| [[media:AN52344-composition-coverage-band-gap-aanalysis-ald-grown-ultra-thin-films.pdf \| ]]\|\|\|\|\|\|\|\|X\|\|\|\|X\|\|X\|\|\|\|Band gap\|\|Gate dielectrics, HfO2, SiO2\|\|~~
	\|-

	{{Template:Nexsa-addpubrow		{{Template:Nexsa-addpubrow
	\|LMdocID=		\|LMdocID=5389
	\|LMdocTitle=		\|LMdocTitle=Confirming the layer structure of an organic FET device
	\|LMdocType=		\|LMdocType=Application note
	\|LMdocAuthor=		\|LMdocAuthor=P Mack
	\|docLink=		\|docLink=https://www.thermofisher.com/document-connect/document-connect.html?url=https://assets.thermofisher.com/TFS-Assets%2FMSD%2FApplication-Notes%2FAN52476-confirming-layer-structure-organic-fet-device.pdf
	\|XPSused= \|UPSused= \|ISSused= \|REELSused= \|Ramanused=		\|XPSused= \|UPSused= \|ISSused= \|REELSused= \|Ramanused=
	\|AdditionalOption=		\|AdditionalOption=MAGCIS
	\|Sample=		\|Sample=Organic FET's
	\|Abstract=		\|Abstract=
	}}		}}
	\| [[media:AN52476-confirming-layer-structure-organic-fet-device.pdf \| ~~Confirming the layer structure of an organic FET device~~]]\|\|~~Application note~~\|\|~~P Mack~~ \|\|\|\|X\|\|\|\|\|\|\|\|\|\|~~MAGCIS~~\|\|~~Organic FET's~~,\|\|		\| [[media:AN52476-confirming-layer-structure-organic-fet-device.pdf \| ]]\|\|\|\| \|\|\|\|X\|\|\|\|\|\|\|\|\|\|\|\|,\|\|
	\|-		\|-
	{{Template:Nexsa-addpubrow		{{Template:Nexsa-addpubrow

Jmli at 17:21, 31 January 2023

2023-01-31T17:21:07Z

@@ Line 11: / Line 11: @@
 {{Template:Nexsa-tableheader}}
-{{Template:Nexsa-addpubrow
 {{Template:Nexsa-addpubrow
 |LMdocID=5385
@@ Line 43: / Line 33: @@
 |AdditionalOption=
 |Sample=TiO<sub>2</sub>, CaCO<sub>3</sub>
-|Abstract=
+|Abstract=X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy are two popular analytical techniques due to their flexibility, ease of use, and the wealth of information they provide. Until recently analysis of a material with both of these techniques required the use of two different instruments, however the development of coincident XPSRaman allows for straightforward and quick utilisation of both techniques opening up new exciting materials characterisation opportunities.
 }}
@@ Line 70: / Line 60: @@
 }}
 |-
-| [[media:AN52344-composition-coverage-band-gap-aanalysis-ald-grown-ultra-thin-films.pdf | Composition, coverage and band gap analysis of ALD-grown ultra thin films]]||Application note||P Mack ||||X||||X||X||||Band gap||Gate dielectrics, HfO2, SiO2||
+| [[media:AN52344-composition-coverage-band-gap-aanalysis-ald-grown-ultra-thin-films.pdf | ]]||||||||X||||X||X||||Band gap||Gate dielectrics, HfO2, SiO2||
 |-
 | [[media:AN52476-confirming-layer-structure-organic-fet-device.pdf | Confirming the layer structure of an organic FET device]]||Application note||P Mack ||||X||||||||||MAGCIS||Organic FET's,||
 |-

Jmli: /* Overview of the processing options on the XPS Nexsa */

2023-01-31T17:14:31Z

Overview of the processing options on the XPS Nexsa

← Older revision		Revision as of 19:14, 31 January 2023
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	{{Template:Nexsa-~~header~~}}		{{Template:Nexsa-tableheader}}
	{{Template:Nexsa-addpubrow		{{Template:Nexsa-addpubrow
	\|LMdocID=		\|LMdocID=

Jmli at 17:13, 31 January 2023

2023-01-31T17:13:35Z

← Older revision		Revision as of 19:13, 31 January 2023
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	*'''Web of Science''': Click here to access the article in the Web of Science database (log on to WoS via DTU Inside in advance, click [http://www.webofknowledge.com.proxy.findit.dtu.dk/wos '''this link''' ] ). This will enable you to browse the cited references and citations of the article.		*'''Web of Science''': Click here to access the article in the Web of Science database (log on to WoS via DTU Inside in advance, click [http://www.webofknowledge.com.proxy.findit.dtu.dk/wos '''this link''' ] ). This will enable you to browse the cited references and citations of the article.
	*'''Abstract''': Hover the mouse over the text to show the abstract of the article.		*'''Abstract''': Hover the mouse over the text to show the abstract of the article.
	[[Template:Nexsa-~~addpubrow]]~~

			{{Template:Nexsa-header}}
	{{Template:Nexsa-addpubrow		{{Template:Nexsa-addpubrow
	\|LMdocID=		\|LMdocID=

Jmli at 17:00, 31 January 2023

2023-01-31T17:00:58Z

@@ Line 9: / Line 9: @@
 *'''Abstract''': Hover the mouse over the text to show the abstract of the article.
 [[Template:Nexsa-addpubrow]]
-{{Template:Nexsa-tableheader}}
+{{Template:Nexsa-addpubrow
 |-
 | [[media:AN52344-composition-coverage-band-gap-aanalysis-ald-grown-ultra-thin-films.pdf | Composition, coverage and band gap analysis of ALD-grown ultra thin films]]||Application note||P Mack ||||X||||X||X||||Band gap||Gate dielectrics, HfO2, SiO2||

Jmli at 13:27, 31 January 2023

2023-01-31T13:27:53Z

← Older revision		Revision as of 15:27, 31 January 2023
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	{{Template:Nexsa-tableheader}}		{{Template:Nexsa-tableheader}}
	~~{{Template:Nexsa-addpubrow~~
	~~\|LMdocID=~~
	~~\|LMdocTitle=~~
	~~\|LMdocType=~~
	~~\|LMdocAuthor=~~
	~~\|docLink=~~
	~~\|XPSused= \|UPSused= \|ISSused= \|REELSused= \|Ramanused=~~
	~~\|AdditionalOption=~~
	~~\|Sample=~~
	~~\|Abstract=~~
	}}
	\| [[media:AN52109_E_Organic_LED_0411M_H_1.pdf \| Multitechnique Surface Characterization of Organic LED Material]]\|\|Application note\|\|P Mack \|\|\|\|X\|\|X\|\|\|\|X\|\|\|\|\|\|Organic LED's\|\|<span title="Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron spectroscopy (UPS). XPS was used to analyze the surface composition of the material and by combining the information from REELS and UPS a full energy level diagram of the material was created using a single instrument."> Abstract</span>		\| [[media:AN52109_E_Organic_LED_0411M_H_1.pdf \| Multitechnique Surface Characterization of Organic LED Material]]\|\|Application note\|\|P Mack \|\|\|\|X\|\|X\|\|\|\|X\|\|\|\|\|\|Organic LED's\|\|<span title="Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron spectroscopy (UPS). XPS was used to analyze the surface composition of the material and by combining the information from REELS and UPS a full energy level diagram of the material was created using a single instrument."> Abstract</span>
	\|-		\|-

Jmli at 13:23, 31 January 2023

2023-01-31T13:23:11Z

@@ Line 119: / Line 119: @@
 {{Template:Nexsa-addpubrow
-|LMdocID=
+|LMdocID=5400
-|LMdocTitle=
+|LMdocTitle=Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions
-|LMdocType=
+|LMdocType=Publication
-|LMdocAuthor=
+|LMdocAuthor=R Steinberger
 |docLink=
-|XPSused=    |UPSused=      |ISSused=      |REELSused=     |Ramanused=
+|XPSused=x    |UPSused=x      |ISSused=x      |REELSused=     |Ramanused=
 |AdditionalOption=
 |Sample=
-|Abstract=
+|Abstract=The electronic and optical properties of GaInZnO (GIZO), HfInZnO (HIZO) and InZnO (IZO) thin films on glass substrates were investigated using X-ray photoelectron spectroscopy (XPS) and reflection electron energy loss spectroscopy (REELS). XPS results show that HIZO, GIZO, and IZO thin films have mixed metal and oxide phases. REELS spectra reveal that the band gaps of GIZO, HIZO, and IZO thin films are 3.1 eV, 3.5 eV, and 3.0 eV, respectively. These band gaps are consistent with optical band gaps determined by UV-Spectrometer. The optical properties represented by the dielectric function ε, the refractive index n, the extinction coefficient k, and the transmission coefficient T of the GIZO, HIZO and IZO thin films were determined from a quantitative analysis of REELS spectra. The transmission coefficient was increased by 4% for the HIZO compound incorporating Hf into IZO, but decreased by 3% for the GIZO compound incorporating Ga into IZO in the visible region in comparison to that of IZO.
 }}
 |-
 |}
 Please don't hesitate to contact us if you find a relevant article to include in the table. Or if any of the articles listed is not suitable.

Jmli at 12:43, 31 January 2023

2023-01-31T12:43:22Z

← Older revision		Revision as of 14:43, 31 January 2023
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	*'''Abstract''': Hover the mouse over the text to show the abstract of the article.		*'''Abstract''': Hover the mouse over the text to show the abstract of the article.
	[[Template:Nexsa-addpubrow]]		[[Template:Nexsa-addpubrow]]

	*[https://labmanager.dtu.dk/function.php?module=Machine&view=currentinfo link ohne streg]
	*[https://labmanager.dtu.dk/function.php?module=Machine&view=currentinfo \| link mit streg]


	{{Template:Nexsa-tableheader}}		{{Template:Nexsa-tableheader}}

Jmli at 12:43, 31 January 2023

2023-01-31T12:43:04Z

@@ Line 1: / Line 1: @@
 == Overview of the processing options on the XPS Nexsa==
 The acquisition of an instrument like the Nexsa has to be done through a EU tender process. As a somewhat unexpected result of this process, we were offered the Nexsa at a very favorable price. We were therefore able to squeeze <span title="The only analytical option (that means excluded chillers, factory training courses, UPS etc) not chosen is a vacuum transfer module " > ''all'' </span> but one of the available options into the budget. That is, of course, very nice indeed, but it also means that we will have to investigate the applications of the various techniques as there is no applications waiting for a specific technique to become available.
@@ Line 102: / Line 99: @@
 {{Template:Nexsa-addpubrow
-|LMdocID=
+|LMdocID=5398
 |LMdocTitle=
 |LMdocType=
@@ Line 113: / Line 134: @@
 }}
 | [[media:Steinberger-2017-Oxygen-accumulation-on-metal-surfac.pdf | Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions]]||Publication||R Steinberger||[http://apps.webofknowledge.com.proxy.findit.dtu.dk/CitedFullRecord.do?product=WOS&colName=WOS&SID=F6P8vdNQigRKywglhCq&search_mode=CitedFullRecord&isickref=WOS:000401391900023 link]||X||||X||||||AES, ARXPS, sputter profiles||Oxygen on metal surfaces||<span title="Depth profiling using surface sensitive analysis methods in combination with sputter ion etching is a common procedure for thorough material investigations, where clean surfaces free of any contaminationare essential. Hence, surface analytic studies are mostly performed under ultra-high vacuum (UHV) conditions, but the cleanness of such UHV environments is usually overrated. Consequently, the current study highlights the in principle known impact of the residual gas on metal surfaces (Fe, Mg, Al, Cr and Zn) for various surface analytics methods, like X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and low-energy ion scattering (LEIS). The investigations with modern, stateof-the-art equipment showed different behaviors for the metal surfaces in UHV during acquisition: (i) no impact for Zn, even after long time, (ii) solely adsorption of oxygen for Fe, slight and slow changes for Cr and (iii) adsorption accompanied by oxide formation for Al and Mg. The efficiency of different counter measures was tested and the acquired knowledge was finally used for ZnMgAl coated steel to obtain accurate depth profiles, which exhibited before serious artifacts when data acquisition was performed in an inconsiderate way."> Abstract</span>
 |-

← Older revision		Revision as of 15:27, 31 January 2023
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	{{Template:Nexsa-tableheader}}		{{Template:Nexsa-tableheader}}
	~~{{Template:Nexsa-addpubrow~~
	~~\|LMdocID=~~
	~~\|LMdocTitle=~~
	~~\|LMdocType=~~
	~~\|LMdocAuthor=~~
	~~\|docLink=~~
	~~\|XPSused= \|UPSused= \|ISSused= \|REELSused= \|Ramanused=~~
	~~\|AdditionalOption=~~
	~~\|Sample=~~
	~~\|Abstract=~~
	}}
	\| [[media:AN52109_E_Organic_LED_0411M_H_1.pdf \| Multitechnique Surface Characterization of Organic LED Material]]\|\|Application note\|\|P Mack \|\|\|\|X\|\|X\|\|\|\|X\|\|\|\|\|\|Organic LED's\|\|<span title="Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron spectroscopy (UPS). XPS was used to analyze the surface composition of the material and by combining the information from REELS and UPS a full energy level diagram of the material was created using a single instrument."> Abstract</span>		\| [[media:AN52109_E_Organic_LED_0411M_H_1.pdf \| Multitechnique Surface Characterization of Organic LED Material]]\|\|Application note\|\|P Mack \|\|\|\|X\|\|X\|\|\|\|X\|\|\|\|\|\|Organic LED's\|\|<span title="Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron Organic LED material was characterized using X-ray photoelectron spectroscopy (XPS), reflected electron energy loss spectroscopy (REELS) and ultraviolet photoelectron spectroscopy (UPS). XPS was used to analyze the surface composition of the material and by combining the information from REELS and UPS a full energy level diagram of the material was created using a single instrument."> Abstract</span>
	\|-		\|-