Specific Process Knowledge/Characterization/X-Ray Diffractometer - Revision history

Mmat at 14:20, 2 June 2025

2025-06-02T14:20:46Z

← Older revision		Revision as of 16:20, 2 June 2025
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	~~{{cc-nanolab}}~~		The contents on this page, including all images and pictures, was created by DTU Nanolab and DTU Electro staff unless otherwise stated.

	'''Feedback to this page''': '''[mailto:nanolabsupport@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X-Ray_Diffractometer click here]'''		'''Feedback to this page''': '''[mailto:nanolabsupport@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X-Ray_Diffractometer click here]'''
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	The Philips DCD IIH x-ray diffractometer used to characterize the layers on epitaxial semiconductor structures - usually III-V compound semiconductors.		The Philips DCD IIH x-ray diffractometer used to characterize the layers on epitaxial semiconductor structures - usually III-V compound semiconductors.

	~~''The X-Ray Diffractometer is maintained by DTU fotonik (not Nanolab) and is therefore not in LabManager!''~~

	X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.		X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.

Mmat at 14:19, 2 June 2025

2025-06-02T14:19:41Z

← Older revision		Revision as of 16:19, 2 June 2025
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	~~'''Feedback to this page''': '''[mailto:danchipsupport@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X~~-~~Ray_Diffractometer click here]'''~~		{{cc-nanolab}}

	''~~Text and photo by staff~~ at DTU Nanolab ~~or DTU Electro (previously DTU Photonics Engineering)~~''		'''Feedback to this page''': '''[mailto:nanolabsupport@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X-Ray_Diffractometer click here]'''
			<br><br>
			'''<p style="color:red;">The X-Ray Diffractometer has been decomissioned. Please find other XRD setups at DTU Nanolab [[Specific Process Knowledge/Characterization/XRD\| ''here''.]]</p>'''

	==X-~~Ray~~ Diffractometer ~~<span style="color:Red">This machine has been decommissioned - see other XRD setups at DTU Nanolab [[Specific Process Knowledge/Characterization/XRD\| HERE]] </span>=~~=		=Philips DCD IIH X-ray Diffractometer=

	[[file:X-ray_diffractometer.jpg\|300px\|right\|thumb\|X-ray diffractometer]]		[[file:X-ray_diffractometer.jpg\|300px\|right\|thumb\|X-ray diffractometer]]

Reet at 08:53, 9 June 2023

2023-06-09T08:53:39Z

← Older revision		Revision as of 10:53, 9 June 2023
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	'''Feedback to this page''': '''[mailto:danchipsupport@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X-Ray_Diffractometer click here]'''		'''Feedback to this page''': '''[mailto:danchipsupport@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X-Ray_Diffractometer click here]'''

	''Text and photo DTU Nanolab ~~internal~~''		''Text and photo by staff at DTU Nanolab or DTU Electro (previously DTU Photonics Engineering)''

	==X-Ray Diffractometer ~~'''DECOMMISSIONED, NO LONGER IN LAB'''~~ ==		==X-Ray Diffractometer <span style="color:Red">This machine has been decommissioned - see other XRD setups at DTU Nanolab [[Specific Process Knowledge/Characterization/XRD\| HERE]] </span>==

	[[file:X-ray_diffractometer.jpg\|300px\|right\|thumb\|X-ray diffractometer]]		[[file:X-ray_diffractometer.jpg\|300px\|right\|thumb\|X-ray diffractometer]]
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	''The X-Ray Diffractometer is maintained by DTU fotonik (not Nanolab) and is therefore not in LabManager!''		''The X-Ray Diffractometer is maintained by DTU fotonik (not Nanolab) and is therefore not in LabManager!''

	~~Nanolab also has a X-Ray Diffractometer for public acess. You can see it by clicking [[Specific Process Knowledge/Characterization/XRD\| HERE]]~~

	X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.		X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.

Reet at 09:30, 11 May 2023

2023-05-11T09:30:30Z

← Older revision		Revision as of 11:30, 11 May 2023
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	'''Feedback to this page''': '''[mailto:danchipsupport@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X-Ray_Diffractometer click here]'''		'''Feedback to this page''': '''[mailto:danchipsupport@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X-Ray_Diffractometer click here]'''

			''Text and photo DTU Nanolab internal''

	==X-Ray Diffractometer '''DECOMMISSIONED, NO LONGER IN LAB''' ==		==X-Ray Diffractometer '''DECOMMISSIONED, NO LONGER IN LAB''' ==

Reet: /* X-Ray Diffractometer */

2023-05-10T12:14:59Z

X-Ray Diffractometer

← Older revision		Revision as of 14:14, 10 May 2023
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	'''Feedback to this page''': '''[mailto:danchipsupport@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X-Ray_Diffractometer click here]'''		'''Feedback to this page''': '''[mailto:danchipsupport@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/X-Ray_Diffractometer click here]'''

	==X-Ray Diffractometer==		==X-Ray Diffractometer '''DECOMMISSIONED, NO LONGER IN LAB''' ==

	[[file:X-ray_diffractometer.jpg\|300px\|right\|thumb\|X-ray diffractometer]]		[[file:X-ray_diffractometer.jpg\|300px\|right\|thumb\|X-ray diffractometer]]

Eves: /* X-Ray Diffractometer */

2021-10-03T12:04:19Z

X-Ray Diffractometer

← Older revision		Revision as of 14:04, 3 October 2021
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	''The X-Ray Diffractometer is maintained by DTU fotonik (not Nanolab) and is therefore not in LabManager!''		''The X-Ray Diffractometer is maintained by DTU fotonik (not Nanolab) and is therefore not in LabManager!''

	Nanolab also has a X-Ray Diffractometer. You can see it by clicking [[Specific Process Knowledge/Characterization/XRD\| HERE]]		Nanolab also has a X-Ray Diffractometer for public acess. You can see it by clicking [[Specific Process Knowledge/Characterization/XRD\| HERE]]

	X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.		X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.

Bghe: /* X-Ray Diffractometer */

2019-08-13T10:03:19Z

X-Ray Diffractometer

← Older revision		Revision as of 12:03, 13 August 2019
Line 8:		Line 8:

	''The X-Ray Diffractometer is maintained by DTU fotonik (not Nanolab) and is therefore not in LabManager!''		''The X-Ray Diffractometer is maintained by DTU fotonik (not Nanolab) and is therefore not in LabManager!''

			Nanolab also has a X-Ray Diffractometer. You can see it by clicking [[Specific Process Knowledge/Characterization/XRD\| HERE]]

	X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.		X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.

Bghe: /* X-Ray Diffractometer */

2019-08-13T09:55:33Z

X-Ray Diffractometer

← Older revision		Revision as of 11:55, 13 August 2019
Line 10:		Line 10:

	X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.		X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.
	For more complex compounds containing 4 elements, known as quaternaries, e.g. Ga<sub>x</sub>In<sub>1-x</sub>As<sub>y</sub>P<sub>1-y</sub>, it is possible to obtain both x and y by combining x-ray diffraction measurements and PL-measurements (see [[~~Specific_Process_Knowledge~~/Characterization/~~PL_Mapper~~\|PL Mapper]]).		For more complex compounds containing 4 elements, known as quaternaries, e.g. Ga<sub>x</sub>In<sub>1-x</sub>As<sub>y</sub>P<sub>1-y</sub>, it is possible to obtain both x and y by combining x-ray diffraction measurements and PL-measurements (see [[Specific Process Knowledge/Characterization/PL mapper\|PL Mapper]]).

	==Equipment performance and process related parameters==		==Equipment performance and process related parameters==

Bghe: /* X-Ray Diffractometer */

2019-08-13T09:53:36Z

X-Ray Diffractometer

← Older revision		Revision as of 11:53, 13 August 2019
Line 7:		Line 7:
	The Philips DCD IIH x-ray diffractometer used to characterize the layers on epitaxial semiconductor structures - usually III-V compound semiconductors.		The Philips DCD IIH x-ray diffractometer used to characterize the layers on epitaxial semiconductor structures - usually III-V compound semiconductors.

	''The X-Ray Diffractometer is maintained by DTU fotonik (not ~~Danchip~~) and is therefore not in LabManager!''		''The X-Ray Diffractometer is maintained by DTU fotonik (not Nanolab) and is therefore not in LabManager!''

	X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.		X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.

Jmli: /* X-Ray Diffractometer */

2015-08-31T10:03:43Z

X-Ray Diffractometer

← Older revision		Revision as of 12:03, 31 August 2015
Line 7:		Line 7:
	The Philips DCD IIH x-ray diffractometer used to characterize the layers on epitaxial semiconductor structures - usually III-V compound semiconductors.		The Philips DCD IIH x-ray diffractometer used to characterize the layers on epitaxial semiconductor structures - usually III-V compound semiconductors.

	''The X-Ray Diffractometer is maintained by DTU fotonik (not Danchip) and is ~~therefor~~ not in LabManager!''		''The X-Ray Diffractometer is maintained by DTU fotonik (not Danchip) and is therefore not in LabManager!''

	X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.		X-ray diffraction is a non-destructive technique to measure the lattice mismatch of epitaxial grown layers. The resulting measurements are also know as rocking-curves. In this way it is possible to get the relative content of e.g. In in Ga<sub>x</sub>In<sub>1-x</sub>As grown on InP. Ga<sub>0.47</sub>In<sub>0.53</sub>As is lattice-matched to InP. Compunds containing three different materials are also called ternaries.