Specific Process Knowledge/Characterization/Lifetime scanner MDPmap - Revision history

Mmat at 17:40, 27 May 2025

2025-05-27T17:40:09Z

← Older revision		Revision as of 19:40, 27 May 2025
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	'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Lifetime_scanner_MDPmap click here]'''		'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Lifetime_scanner_MDPmap click here]'''
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2025-05-27T17:39:22Z

← Older revision		Revision as of 19:39, 27 May 2025
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	'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Lifetime_scanner_MDPmap click here]'''		'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Lifetime_scanner_MDPmap click here]'''
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	~~''This page is written by DTU Nanolab internal''~~		<br>

	[[image:Lifetimescanner04.jpg\|400x400px\|right\|thumb\|Lifetime scanner MPDmap, positioned in cleanroom F-2.]]		[[image:Lifetimescanner04.jpg\|400x400px\|right\|thumb\|Lifetime scanner MPDmap, positioned in cleanroom F-2.]]

2023-05-10T07:32:34Z

← Older revision		Revision as of 09:32, 10 May 2023
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	'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Lifetime_scanner_MDPmap click here]'''		'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Lifetime_scanner_MDPmap click here]'''

			''This page is written by DTU Nanolab internal''

	[[image:Lifetimescanner04.jpg\|400x400px\|right\|thumb\|Lifetime scanner MPDmap, positioned in cleanroom F-2.]]		[[image:Lifetimescanner04.jpg\|400x400px\|right\|thumb\|Lifetime scanner MPDmap, positioned in cleanroom F-2.]]

2022-08-08T12:53:22Z

Equipment performance and process related parameters

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	*~~F-2~~		*Cx1

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2020-03-18T20:34:51Z

Performance information

← Older revision		Revision as of 22:34, 18 March 2020
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	'''Material''': Silicon, epitaxial layers, partially or fully processed wafers, compound semiconductors and beyond.		'''Material''': Silicon, epitaxial layers, partially or fully processed wafers, compound semiconductors and beyond.

	'''Measureable properties''': Carrier lifetime (steady state or non equilibrium (µ -PCD) selectable), photoconductivity (steady state) microwave Photoconductance Decay (µ-PCD)		'''Measureable properties''': Carrier lifetime (steady state or non equilibrium (µ -PCD) selectable), photoconductivity (steady state) microwave Photoconductance Decay (µ-PCD)

	==Equipment performance and process related parameters==		==Equipment performance and process related parameters==

2020-03-18T20:34:41Z

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 length, L, can be measured also at very low injection levels with a spatial resolution limited
 only by the diffusion length of the charge carriers.
 '''Range of lifetimes''': 20 ns to several ms
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 '''Measureable properties''': Carrier lifetime (steady state or non equilibrium (µ -PCD) selectable), photoconductivity (steady state) microwave Photoconductance Decay (µ-PCD)
 ==Equipment performance and process related parameters==

2020-03-18T20:33:36Z

← Older revision		Revision as of 22:33, 18 March 2020
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	[[image:Lifetimescanner04.jpg\|400x400px\|right\|thumb\|Lifetime scanner MPDmap, positioned in cleanroom D-3.]]		[[image:Lifetimescanner04.jpg\|400x400px\|right\|thumb\|Lifetime scanner MPDmap, positioned in cleanroom F-2.]]

	== Microwave Detected Photoconductivity (MDP) ==		== Microwave Detected Photoconductivity (MDP) ==

2020-03-18T20:31:49Z

Microwave Detected Photoconductivity (MDP)

← Older revision		Revision as of 22:31, 18 March 2020
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	length, L, can be measured also at very low injection levels with a spatial resolution limited		length, L, can be measured also at very low injection levels with a spatial resolution limited
	only by the diffusion length of the charge carriers.		only by the diffusion length of the charge carriers.

			'''Range of lifetimes''': 20 ns to several ms

			'''The resistivity range for lifetime measurements''' 0.2 to 100 Ohm.cm, p/n

			'''Material''': Silicon, epitaxial layers, partially or fully processed wafers, compound semiconductors and beyond.

			'''Measureable properties''': Carrier lifetime (steady state or non equilibrium (µ -PCD) selectable), photoconductivity (steady state) microwave Photoconductance Decay (µ-PCD)


	'''The user manual, the APV and contact information can be found in LabManager:'''		'''The user manual, the APV and contact information can be found in LabManager:'''

2020-03-18T20:25:48Z

Equipment performance and process related parameters

← Older revision		Revision as of 22:25, 18 March 2020
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	*405 nm		*405 nm
	**Power 5 mW to 100 mW		**Power 5 mW to 100 mW
	*~~978~~ nm		*977 nm
	**Power 5 mW to ~~140~~ mW		**Power 5 mW to 190 mW
	*975 nm		*975 nm
	**Power 0.5 W to 4.0 W		**Power 0.5 W to 4.0 W
			*977 nm
			**Power up to 200 µW
	*Spot diameter for all laser 0.5 µm		*Spot diameter for all laser 0.5 µm
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2020-03-18T20:20:55Z

Equipment performance and process related parameters

← Older revision		Revision as of 22:20, 18 March 2020
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	*D-3		*F-2

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