Specific Process Knowledge/Characterization - Revision history

Mmat at 14:09, 20 June 2025

2025-06-20T14:09:16Z

← Older revision		Revision as of 16:09, 20 June 2025
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	==Decommissioned equipment==		==Decommissioned equipment==
	*[[/KLA-Tencor Surfscan 6420\|KLA-Tencor Surfscan 6420]]		*[[/KLA-Tencor Surfscan 6420\|KLA-Tencor Surfscan 6420]]
	*[[/X-Ray Diffractometer\|Phillips X-Ray Diffractometer ~~that was~~ owned by DTU Fotonik]]		*[[/X-Ray Diffractometer\|Phillips X-Ray Diffractometer (owned by DTU Fotonik)]]

Mmat at 12:12, 17 June 2025

2025-06-17T12:12:50Z

← Older revision		Revision as of 14:12, 17 June 2025
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	===Electrical measurements===		===Electrical measurements===
	*[[/4-Point Probe\|4-Point Probe]]		*[[/Four-Point Probe\|4-Point Probe]]
	*[[/Probe station\|Probe station]]		*[[/Probe station\|Probe station]]
	*[[/III-V ECV-profiler\|III-V ECV-profiler (Electrochemical Capacitance-Voltage carrier density profiler)]]		*[[/III-V ECV-profiler\|III-V ECV-profiler (Electrochemical Capacitance-Voltage carrier density profiler)]]

Mmat at 12:12, 17 June 2025

2025-06-17T12:12:08Z

← Older revision		Revision as of 14:12, 17 June 2025
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	\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/XPS\|XPS]]		\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/XPS\|XPS]]
	\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/PL_mapper\|PL mapper]]		\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/PL_mapper\|PL mapper]]
	\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[~~Specific_Process_Knowledge~~/Characterization/4-~~Point_Probe~~\|4-point probe]]		\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific Process Knowledge/Characterization/Four-Point Probe\|4-point probe]]
	\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/Probe_station\|Probe station]]		\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/Probe_station\|Probe station]]
	\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/XRD\|XRD]]		\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/XRD\|XRD]]

Mmat at 11:50, 17 June 2025

2025-06-17T11:50:57Z

← Older revision		Revision as of 13:50, 17 June 2025
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	*[[LabAdviser/314/Microscopy 314-307/TEM/ATEM \|Titan ATEM]]		*[[LabAdviser/314/Microscopy 314-307/TEM/ATEM \|Titan ATEM]]
	*[[LabAdviser/314/Microscopy 314-307/TEM/ETEM \|Titan ETEM]]		*[[LabAdviser/314/Microscopy 314-307/TEM/ETEM \|Titan ETEM]]
	*[[LabAdviser/~~CEN~~/~~Tecnai~~ TEM \|Tecnai TEM]]		*[[LabAdviser/314/Microscopy 314-307/TEM/T20 \|Tecnai TEM]]

	===XRD===		===XRD===

Mmat at 10:04, 17 June 2025

2025-06-17T10:04:22Z

← Older revision		Revision as of 12:04, 17 June 2025
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	===TEMs at DTU Nanolab - building 307/314===		===TEMs at DTU Nanolab - building 307/314===
	*[[LabAdviser/~~CEN~~/~~Titan~~ ATEM \|Titan ATEM]]		*[[LabAdviser/314/Microscopy 314-307/TEM/ATEM \|Titan ATEM]]
	*[[LabAdviser/~~CEN~~/~~Titan~~ ETEM \|Titan ETEM]]		*[[LabAdviser/314/Microscopy 314-307/TEM/ETEM \|Titan ETEM]]
	*[[LabAdviser/CEN/Tecnai TEM \|Tecnai TEM]]		*[[LabAdviser/CEN/Tecnai TEM \|Tecnai TEM]]

Mmat at 10:02, 17 June 2025

2025-06-17T10:02:24Z

← Older revision		Revision as of 12:02, 17 June 2025
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	*[[LabAdviser/314/Microscopy 314-307/FIB/Helios\|Dual Beam FEI Helios Nanolab 600]]		*[[LabAdviser/314/Microscopy 314-307/FIB/Helios\|Dual Beam FEI Helios Nanolab 600]]
	*[[LabAdviser/314/Microscopy 314-307/SEM/Nova\|SEM FEI Nova 600 NanoSEM]]		*[[LabAdviser/314/Microscopy 314-307/SEM/Nova\|SEM FEI Nova 600 NanoSEM]]
	*[[LabAdviser/~~CEN~~/~~Quanta FEG 200 ESEM~~\|SEM FEI Quanta 200 ESEM FEG]]		*[[
			LabAdviser/314/Microscopy 314-307/SEM/QFEG\|SEM FEI Quanta 200 ESEM FEG]]
	<!-- *[[LabAdviser/CEN/Inspect S\|SEM Inspect S]] -->		<!-- *[[LabAdviser/CEN/Inspect S\|SEM Inspect S]] -->

Mmat at 09:48, 17 June 2025

2025-06-17T09:48:38Z

← Older revision		Revision as of 11:48, 17 June 2025
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	<!-- *[[LabAdviser/CEN/Quanta 3D FIB/SEM\|FIB-SEM FEI QUANTA 200 3D]] -->		<!-- *[[LabAdviser/CEN/Quanta 3D FIB/SEM\|FIB-SEM FEI QUANTA 200 3D]] -->
	*[[LabAdviser/314/Microscopy 314-307/FIB/Helios\|Dual Beam FEI Helios Nanolab 600]]		*[[LabAdviser/314/Microscopy 314-307/FIB/Helios\|Dual Beam FEI Helios Nanolab 600]]
	*[[LabAdviser/~~CEN~~/Nova ~~NanoSEM 600~~\|SEM FEI Nova 600 NanoSEM]]		*[[LabAdviser/314/Microscopy 314-307/SEM/Nova\|SEM FEI Nova 600 NanoSEM]]
	*[[LabAdviser/CEN/Quanta FEG 200 ESEM\|SEM FEI Quanta 200 ESEM FEG]]		*[[LabAdviser/CEN/Quanta FEG 200 ESEM\|SEM FEI Quanta 200 ESEM FEG]]
	<!-- *[[LabAdviser/CEN/Inspect S\|SEM Inspect S]] -->		<!-- *[[LabAdviser/CEN/Inspect S\|SEM Inspect S]] -->

Mmat: /* SEMs at DTU Nanolab - building 307/314 */

2025-06-17T09:38:20Z

SEMs at DTU Nanolab - building 307/314

← Older revision		Revision as of 11:38, 17 June 2025
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	===SEMs at DTU Nanolab - building 307/314===		===SEMs at DTU Nanolab - building 307/314===
	<!-- *[[LabAdviser/CEN/Quanta 3D FIB/SEM\|FIB-SEM FEI QUANTA 200 3D]] -->		<!-- *[[LabAdviser/CEN/Quanta 3D FIB/SEM\|FIB-SEM FEI QUANTA 200 3D]] -->
	*[[LabAdviser/~~CEN~~/Helios ~~Nanolab 600~~\|Dual Beam FEI Helios Nanolab 600]]		*[[LabAdviser/314/Microscopy 314-307/FIB/Helios\|Dual Beam FEI Helios Nanolab 600]]
	*[[LabAdviser/CEN/Nova NanoSEM 600\|SEM FEI Nova 600 NanoSEM]]		*[[LabAdviser/CEN/Nova NanoSEM 600\|SEM FEI Nova 600 NanoSEM]]
	*[[LabAdviser/CEN/Quanta FEG 200 ESEM\|SEM FEI Quanta 200 ESEM FEG]]		*[[LabAdviser/CEN/Quanta FEG 200 ESEM\|SEM FEI Quanta 200 ESEM FEG]]

Mmat: /* Overview of characteristics and where to measure it */

2025-05-28T11:05:48Z

Overview of characteristics and where to measure it

← Older revision		Revision as of 13:05, 28 May 2025
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	\|}		\|}
	<br clear="all">		<br clear="all">
	~~<br>~~

	~~This is page content.<ref>''LibreOffice For Starters'', First Edition, Flexible Minds, Manchester, 2002, p. 18</ref>~~
	~~{{reflist}}~~

	<sup>{{fn\|1}}</sup> Using the cross section method<br>		<sup>{{fn\|1}}</sup> Using the cross section method<br>
	<sup>{{fn\|2}}</sup> Using the create step method<br>		<sup>{{fn\|2}}</sup> Using the create step method<br>

Mmat: /* Overview of characteristics and where to measure it */

2025-05-28T11:04:16Z

Overview of characteristics and where to measure it

← Older revision		Revision as of 13:04, 28 May 2025
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	<br>		<br>

	<sup>{{fn\|1}}</sup> Using the cross section method=		This is page content.<ref>''LibreOffice For Starters'', First Edition, Flexible Minds, Manchester, 2002, p. 18</ref>
			{{reflist}}

			<sup>{{fn\|1}}</sup> Using the cross section method<br>
	<sup>{{fn\|2}}</sup> Using the create step method<br>		<sup>{{fn\|2}}</sup> Using the create step method<br>
	<sup>{{fn\|3}}</sup> With known resistivity<br>		<sup>{{fn\|3}}</sup> With known resistivity<br>

← Older revision		Revision as of 14:12, 17 June 2025
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	\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/XPS\|XPS]]		\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/XPS\|XPS]]
	\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/PL_mapper\|PL mapper]]		\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/PL_mapper\|PL mapper]]
	\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[~~Specific_Process_Knowledge~~/Characterization/4-~~Point_Probe~~\|4-point probe]]		\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific Process Knowledge/Characterization/Four-Point Probe\|4-point probe]]
	\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/Probe_station\|Probe station]]		\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/Probe_station\|Probe station]]
	\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/XRD\|XRD]]		\| width="30" align="center" style="writing-mode: vertical-lr; transform: rotate(180deg);background:#f0f0f0;"\|[[Specific_Process_Knowledge/Characterization/XRD\|XRD]]

← Older revision		Revision as of 12:02, 17 June 2025
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	*[[LabAdviser/314/Microscopy 314-307/FIB/Helios\|Dual Beam FEI Helios Nanolab 600]]		*[[LabAdviser/314/Microscopy 314-307/FIB/Helios\|Dual Beam FEI Helios Nanolab 600]]
	*[[LabAdviser/314/Microscopy 314-307/SEM/Nova\|SEM FEI Nova 600 NanoSEM]]		*[[LabAdviser/314/Microscopy 314-307/SEM/Nova\|SEM FEI Nova 600 NanoSEM]]
	*[[LabAdviser/~~CEN~~/~~Quanta FEG 200 ESEM~~\|SEM FEI Quanta 200 ESEM FEG]]		*[[
			LabAdviser/314/Microscopy 314-307/SEM/QFEG\|SEM FEI Quanta 200 ESEM FEG]]
	<!-- *[[LabAdviser/CEN/Inspect S\|SEM Inspect S]] -->		<!-- *[[LabAdviser/CEN/Inspect S\|SEM Inspect S]] -->

← Older revision		Revision as of 11:48, 17 June 2025
Line 171:		Line 171:
	<!-- *[[LabAdviser/CEN/Quanta 3D FIB/SEM\|FIB-SEM FEI QUANTA 200 3D]] -->		<!-- *[[LabAdviser/CEN/Quanta 3D FIB/SEM\|FIB-SEM FEI QUANTA 200 3D]] -->
	*[[LabAdviser/314/Microscopy 314-307/FIB/Helios\|Dual Beam FEI Helios Nanolab 600]]		*[[LabAdviser/314/Microscopy 314-307/FIB/Helios\|Dual Beam FEI Helios Nanolab 600]]
	*[[LabAdviser/~~CEN~~/Nova ~~NanoSEM 600~~\|SEM FEI Nova 600 NanoSEM]]		*[[LabAdviser/314/Microscopy 314-307/SEM/Nova\|SEM FEI Nova 600 NanoSEM]]
	*[[LabAdviser/CEN/Quanta FEG 200 ESEM\|SEM FEI Quanta 200 ESEM FEG]]		*[[LabAdviser/CEN/Quanta FEG 200 ESEM\|SEM FEI Quanta 200 ESEM FEG]]
	<!-- *[[LabAdviser/CEN/Inspect S\|SEM Inspect S]] -->		<!-- *[[LabAdviser/CEN/Inspect S\|SEM Inspect S]] -->

← Older revision		Revision as of 11:38, 17 June 2025
Line 170:		Line 170:
	===SEMs at DTU Nanolab - building 307/314===		===SEMs at DTU Nanolab - building 307/314===
	<!-- *[[LabAdviser/CEN/Quanta 3D FIB/SEM\|FIB-SEM FEI QUANTA 200 3D]] -->		<!-- *[[LabAdviser/CEN/Quanta 3D FIB/SEM\|FIB-SEM FEI QUANTA 200 3D]] -->
	*[[LabAdviser/~~CEN~~/Helios ~~Nanolab 600~~\|Dual Beam FEI Helios Nanolab 600]]		*[[LabAdviser/314/Microscopy 314-307/FIB/Helios\|Dual Beam FEI Helios Nanolab 600]]
	*[[LabAdviser/CEN/Nova NanoSEM 600\|SEM FEI Nova 600 NanoSEM]]		*[[LabAdviser/CEN/Nova NanoSEM 600\|SEM FEI Nova 600 NanoSEM]]
	*[[LabAdviser/CEN/Quanta FEG 200 ESEM\|SEM FEI Quanta 200 ESEM FEG]]		*[[LabAdviser/CEN/Quanta FEG 200 ESEM\|SEM FEI Quanta 200 ESEM FEG]]