LabAdviser/314/Preparation 314-307/Solid-matter - Revision history

Jenk at 09:21, 19 November 2024

2024-11-19T09:21:11Z

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			= Ion Milling =
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	~~= Ion Milling =~~
	== Fischione Low Angle Ion Milling and Polishing System Model 1010 ==		== Fischione Low Angle Ion Milling and Polishing System Model 1010 ==

Jenk: /* Ion Milling */

2024-11-19T09:20:36Z

Ion Milling

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	= Ion Milling =		= Ion Milling =
	== Fischione Low Angle Ion Milling and Polishing System Model 1010 ==		== Fischione Low Angle Ion Milling and Polishing System Model 1010 ==
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	== Fischione NanoMill model 1040 ==		== Fischione NanoMill model 1040 ==

Jenk at 06:59, 28 September 2023

2023-09-28T06:59:27Z

← Older revision		Revision as of 08:59, 28 September 2023
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	[[Category:314]]		[[Category:314]]
	[[Category:314-Preparation]]		[[Category:314-Preparation]]


			Mechanical preparation equipment is available for experience users, who know how to use the equipment. Access to the preparation lab is needed. We do not provide training on the equipment.


	= Cutting =		= Cutting =

Jenk: /* Fischione Low Angle Ion Milling and Polishing System Model 1010 */

2023-06-27T14:25:11Z

Fischione Low Angle Ion Milling and Polishing System Model 1010

← Older revision		Revision as of 16:25, 27 June 2023
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	The Fischione Ion Mill is used for producing TEM specimens with large electron transparent areas. Samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The milling or polishing is performed by argon ions. The instrument has two independently adjustable Hollow Anode Discharge (HAD) argon ion sources, which can be operated from 0.5 to 6.0 kV with currents from 3 mA to 8 mA. The milling angle can be adjusted in the range of 0° to 45°. Tuning the milling parameters allows for coarse or gentle milling and the goal is to get clean samples free of physical or chemical artifacts		The Fischione Ion Mill is used for producing TEM specimens with large electron transparent areas. Samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The milling or polishing is performed by argon ions. The instrument has two independently adjustable Hollow Anode Discharge (HAD) argon ion sources, which can be operated from 0.5 to 6.0 kV with currents from 3 mA to 8 mA. The milling angle can be adjusted in the range of 0° to 45°. Tuning the milling parameters allows for coarse or gentle milling and the goal is to get clean samples free of physical or chemical artifacts

	[[:~~File:Operation Manual Fischione_1010~~.pdf]]		[https://labmanager.dtu.dk/view_binary.php?class=MiscDocument&id=15&name=Operation_Manual_Fischione_1010.pdf Manual] ''- requires login''

	[[File:IMG_3674.JPG\|300px\|left\|thumb\|Location Building 307, Prep Lab 109]].<br />		[[File:IMG_3674.JPG\|300px\|left\|thumb\|Location Building 307, Prep Lab 109]].<br />

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	== Fischione NanoMill model 1040 ==		== Fischione NanoMill model 1040 ==

Jenk: /* Dimple Grinder */

2023-06-27T14:24:37Z

Dimple Grinder

← Older revision		Revision as of 16:24, 27 June 2023
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	== Dimple Grinder ==		== Dimple Grinder ==

	[~~http~~://~~www~~.~~labmet~~.~~cl/Documentos/Manuales~~/Manual~~%20~~-~~%20DIMPLING%20GRINDER%20MODEL%20200~~.pdf Manual]		[https://labmanager.dtu.dk/view_binary.php?class=MiscDocument&id=15&name=Manual+-+DIMPLING+GRINDER+MODEL+200.pdf Manual] ''- requires login''

	[[File:Dimple_Grinder.jpg\|200px\|left\|thumb\|Location Building 307, Prep Lab 109]].<br />		[[File:Dimple_Grinder.jpg\|200px\|left\|thumb\|Location Building 307, Prep Lab 109]].<br />

Jenk: /* Ultrasonic cutter */

2023-06-27T14:24:09Z

Ultrasonic cutter

← Older revision		Revision as of 16:24, 27 June 2023
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	== Ultrasonic cutter ==		== Ultrasonic cutter ==

	[~~http~~://~~www~~.~~labmet~~.~~cl/Documentos/Manuales~~/Manual~~%20~~-~~%20ULTRASONIC%20DISK%20CUTTER%20MODEL%20170~~.pdf Manual]		[https://labmanager.dtu.dk/view_binary.php?class=MiscDocument&id=15&name=Manual+-+ULTRASONIC+DISK+CUTTER+MODEL+170.pdf Manual] ''- requires login''

	[[File:Ultrasonic_Cutter.jpg\|200px\|left\|thumb\|Location Building 307, Prep Lab 109]].<br />		[[File:Ultrasonic_Cutter.jpg\|200px\|left\|thumb\|Location Building 307, Prep Lab 109]].<br />

Jenk: /* Fischione NanoMill model 1040 */

2023-06-27T14:21:27Z

Fischione NanoMill model 1040

← Older revision		Revision as of 16:21, 27 June 2023
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	This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.		This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.

	[http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system ~~Broshure~~]		[http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system Brochure]

	[[File:IMG_3679.JPG\|250px\|left\|thumb\|Location Building 314, Common Area]]		[[File:IMG_3679.JPG\|250px\|left\|thumb\|Location Building 314, Common Area]]

Jenk: /* Fischione NanoMill model 1040 */

2023-06-27T14:21:16Z

Fischione NanoMill model 1040

← Older revision		Revision as of 16:21, 27 June 2023
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	This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.		This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.

	[http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system ~~Operation Manual~~]		[http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system Broshure]

	[[File:IMG_3679.JPG\|250px\|left\|thumb\|Location Building 314, Common Area]]		[[File:IMG_3679.JPG\|250px\|left\|thumb\|Location Building 314, Common Area]]

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	= Missing equipment =		= Missing equipment =

Jenk at 08:19, 27 June 2023

2023-06-27T08:19:43Z

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	'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Preparation_314-307/Solid-matter click here]'''		'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Preparation_314-307/Solid-matter click here]'''

			''This section is written by DTU Nanolab internal if nothing else is stated.''
	[[Category:314]]		[[Category:314]]
	[[Category:314-Preparation]]		[[Category:314-Preparation]]

Jenk at 08:25, 25 November 2021

2021-11-25T08:25:30Z

← Older revision		Revision as of 10:25, 25 November 2021
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	= Grinding/Polishing =		= Grinding/Polishing =
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	== Dimple Grinder ==		== Dimple Grinder ==