LabAdviser/314/Microscopy 314-307/TEM/ATEM - Revision history

Mmat at 21:48, 16 June 2025

2025-06-16T21:48:06Z

← Older revision		Revision as of 23:48, 16 June 2025
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	= Calibration =		= Calibration =

	*[[~~index.php?title=~~Media:ATEM collection-angles.xlsx\|GIF collection angles (20220209)]]		*[[Media:ATEM collection-angles.xlsx\|GIF collection angles (20220209)]]
	*Magnification calibration cameras		*Magnification calibration cameras
	*Convergence angles STEM		*Convergence angles STEM

Jenk at 08:15, 8 January 2025

2025-01-08T08:15:18Z

← Older revision		Revision as of 10:15, 8 January 2025
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	'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=LabAdviser/314/Microscopy_314-307/TEM/ATEM click here]'''		'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=LabAdviser/314/Microscopy_314-307/TEM/ATEM click here]'''

	[[~~index.php?title=~~Category:314]]		[[Category:314]]
	[[~~index.php?title=~~Category:314-Microscopy]]		[[Category:314-Microscopy]]

	''This section is written by DTU Nanolab internal if nothing else is stated.''		''This section is written by DTU Nanolab internal if nothing else is stated.''

	[[File:Warning Computer Machine.png\|left~~\|thumb~~\|100x100px]]		[[File:Warning Computer Machine.png\|left\|100x100px]]

	== The Titan ATEM is not available at DTU Nanolab any longer. The information here is just for reference. ==		== The Titan ATEM is not available at DTU Nanolab any longer. The information here is just for reference. ==

Jenk at 08:08, 8 January 2025

2025-01-08T08:08:57Z

← Older revision		Revision as of 10:08, 8 January 2025
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	<!-- <span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png\|200px]] -->		<!-- <span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png\|200px]] -->
	'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=LabAdviser/314/Microscopy_314-307/TEM/ATEM click here]'''		'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=LabAdviser/314/Microscopy_314-307/TEM/ATEM click here]'''

			[[index.php?title=Category:314]]
			[[index.php?title=Category:314-Microscopy]]

	''This section is written by DTU Nanolab internal if nothing else is stated.''		''This section is written by DTU Nanolab internal if nothing else is stated.''

			[[File:Warning Computer Machine.png\|left\|thumb\|100x100px]]

	== The Titan ATEM is not available at DTU Nanolab any longer. The information here is just for reference. ==		== The Titan ATEM is not available at DTU Nanolab any longer. The information here is just for reference. ==
			<br />

	~~[[index.php?title=Category:314]]~~
	~~[[index.php?title=Category:314-Microscopy]]~~

	[[image:8212.JPG\|400x400px\|right\|thumb\|Titan ATEM in building 314.]]		[[image:8212.JPG\|400x400px\|right\|thumb\|Titan ATEM in building 314.]]

Jenk at 07:56, 8 January 2025

2025-01-08T07:56:47Z

← Older revision		Revision as of 09:56, 8 January 2025
Line 3:		Line 3:

	''This section is written by DTU Nanolab internal if nothing else is stated.''		''This section is written by DTU Nanolab internal if nothing else is stated.''
	[[Category:314]]
	[[Category:314-Microscopy]]		== The Titan ATEM is not available at DTU Nanolab any longer. The information here is just for reference. ==


			[[index.php?title=Category:314]]
			[[index.php?title=Category:314-Microscopy]]

	[[image:8212.JPG\|400x400px\|right\|thumb\|Titan ATEM in building 314.]]		[[image:8212.JPG\|400x400px\|right\|thumb\|Titan ATEM in building 314.]]
Line 38:		Line 42:
	= Calibration =		= Calibration =

	*[[~~media~~:~~ATEM_collection~~-angles.~~xlsx‎~~ \|GIF collection angles (20220209)]]		*[[index.php?title=Media:ATEM collection-angles.xlsx\|GIF collection angles (20220209)]]
	*Magnification calibration cameras		*Magnification calibration cameras
	*Convergence angles STEM		*Convergence angles STEM

Jenk at 08:10, 27 June 2023

2023-06-27T08:10:13Z

← Older revision		Revision as of 10:10, 27 June 2023
Line 2:		Line 2:
	'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=LabAdviser/314/Microscopy_314-307/TEM/ATEM click here]'''		'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=LabAdviser/314/Microscopy_314-307/TEM/ATEM click here]'''

			''This section is written by DTU Nanolab internal if nothing else is stated.''
	[[Category:314]]		[[Category:314]]
	[[Category:314-Microscopy]]		[[Category:314-Microscopy]]

Jenk: /* Calibration */

2022-02-10T09:41:01Z

Calibration

← Older revision		Revision as of 11:41, 10 February 2022
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	= Calibration =		= Calibration =

	Collection angles GIF <!-- [[media:~~Calibration_collection angle_3Feb10~~.~~docx~~\|~~Calibration_collection angle_3Feb10~~]] ~~-->~~		*[[media:ATEM_collection-angles.xlsx‎ \|GIF collection angles (20220209)]]
	*Magnification calibration cameras		*Magnification calibration cameras
	*Convergence angles STEM		*Convergence angles STEM


	= Process information =		= Process information =

Jenk at 13:31, 8 February 2022

2022-02-08T13:31:30Z

← Older revision		Revision as of 15:31, 8 February 2022
Line 40:		Line 40:
	*Magnification calibration cameras		*Magnification calibration cameras
	*Convergence angles STEM		*Convergence angles STEM


	= Process information =		= Process information =

Jenk: /* Calibration */

2022-02-08T13:30:47Z

Calibration

← Older revision		Revision as of 15:30, 8 February 2022
Line 37:		Line 37:
	= Calibration =		= Calibration =

	*[[media:Calibration_collection angle_3Feb10.docx\|Calibration_collection angle_3Feb10]]		Collection angles GIF <!-- [[media:Calibration_collection angle_3Feb10.docx\|Calibration_collection angle_3Feb10]] -->
	*Magnification calibration cameras		*Magnification calibration cameras
	*Convergence angles STEM		*Convergence angles STEM


	= Process information =		= Process information =

Jenk: /* FEI Titan 80-300 ATEM */

2022-02-07T15:00:46Z

FEI Titan 80-300 ATEM

← Older revision		Revision as of 17:00, 7 February 2022
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	Titan Analytical can be used in two conditions, transmission (TEM) and scanning transmission (STEM) modes. It is equipped with the FEI X-FEG gun and monochromator, which allows experiments at 120 kV or 300 kV acceleration voltage. With the momochromator, the energy spread can be adjusted between about 1 eV and below 0.2 eV. Furthermore, a CEOS CESCOR Cs-corrector of the condenser lens system is installed. The objective lens has the super-twin (S-Twin) pole piece with 5.2 mm pole gap (Cs about 1.2 mm). The point (interpretable) resolutions for TEM and STEM at 300 kV are 0.2 and 0.08 nm, respectively, which allows atomic arrangements in materials to be visualized clearly. For TEM, a Gatan Ultrascan US1000 CCD (2048x2048 px) is installed, for STEM, a high-angle annular dark field detector (HAADF) or BF/DF detector of the GIF system can be used.<br />		Titan Analytical can be used in two conditions, transmission (TEM) and scanning transmission (STEM) modes. It is equipped with the FEI X-FEG gun and monochromator, which allows experiments at 120 kV or 300 kV acceleration voltage. With the momochromator, the energy spread can be adjusted between about 1 eV and below 0.2 eV. Furthermore, a CEOS CESCOR Cs-corrector of the condenser lens system is installed. The objective lens has the super-twin (S-Twin) pole piece with 5.2 mm pole gap (Cs about 1.2 mm). The point (interpretable) resolutions for TEM and STEM at 300 kV are 0.2 and 0.08 nm, respectively, which allows atomic arrangements in materials to be visualized clearly. For TEM, a Gatan Ultrascan US1000 CCD (2048x2048 px) is installed, for STEM, a high-angle annular dark field detector (HAADF) or BF/DF detector of the GIF system can be used.<br />

	For energy dispersive X-ray spectroscopy (EDS) an Oxford windowless X-Max ~~80TLE~~ detector is installed, which is running Oxford Aztec analysis software. For electron energy loss spectroscopy (EELS) and energy filtered imaging (EF-TEM), the microscope is equipped with a Gatan Tridiem 865 GIF and a Gatan Ultrascan US1000 CCD (2048x2048 px). The microscope can be used for elemental analysis from regions that are as small as 1 nm and is specifically suited for EDS and EELS mapping (Gatan Digiscan). Specially, monochromated EELS, which is reachable to an energy resolution of 0.15 eV, allows the distribution of surface plasmons in nanostructured materials to be imaged at the nanometer scale and makes possible to determine the valence state of elements (e.g., Fe2+/Fe3+ ratios).<br />		For energy dispersive X-ray spectroscopy (EDS) an Oxford windowless X-Max 100TLE detector is installed, which is running Oxford Aztec analysis software. For electron energy loss spectroscopy (EELS) and energy filtered imaging (EF-TEM), the microscope is equipped with a Gatan Tridiem 865 GIF and a Gatan Ultrascan US1000 CCD (2048x2048 px). The microscope can be used for elemental analysis from regions that are as small as 1 nm and is specifically suited for EDS and EELS mapping (Gatan Digiscan). Specially, monochromated EELS, which is reachable to an energy resolution of 0.15 eV, allows the distribution of surface plasmons in nanostructured materials to be imaged at the nanometer scale and makes possible to determine the valence state of elements (e.g., Fe2+/Fe3+ ratios).<br />

	This microscope is also dedicated to magnetic and electrostatic potential imaging since it has a biprism located at a selected-area aperture position and a Lorentz lens. This capability not only offers us to characterize magnetic materials and semiconductor devices but also may make possible to visualize different chemical states in low-density materials such as polymers and biological specimens. <br />		This microscope is also dedicated to magnetic and electrostatic potential imaging since it has a biprism located at a selected-area aperture position and a Lorentz lens. This capability not only offers us to characterize magnetic materials and semiconductor devices but also may make possible to visualize different chemical states in low-density materials such as polymers and biological specimens. <br />

Jenk: /* Process information */

2022-01-25T08:57:12Z

Process information

← Older revision		Revision as of 10:57, 25 January 2022
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	Processes:		Processes:
	*Monochromated STEM-EELS for low-loss experiments		*Monochromated STEM-EELS for low-loss experiments

			<br />

	= Tips and Tricks =		= Tips and Tricks =