LabAdviser/314/Microscopy 314-307/FIB/Hydra - Revision history

Jenk at 09:16, 9 September 2025

2025-09-09T09:16:07Z

← Older revision		Revision as of 11:16, 9 September 2025
Line 3:		Line 3:
	''This section is written by DTU Nanolab internal if nothing else is stated.''		''This section is written by DTU Nanolab internal if nothing else is stated.''

	[[~~index.php?title=~~Category:314]]		[[Category:314]]
	[[~~index.php?title=~~Category:314-Microscopy]]		[[Category:314-Microscopy]]
	=Helios 5 Hydra UX DualBeam=		=Helios 5 Hydra UX DualBeam=

Jenk at 09:15, 9 September 2025

2025-09-09T09:15:43Z

← Older revision		Revision as of 11:15, 9 September 2025
Line 1:		Line 1:
	~~<span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png\|200px]]~~

	'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Microscopy_314-307/FIB/Helios click here]'''		'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Microscopy_314-307/FIB/Helios click here]'''

	''This section is written by DTU Nanolab internal if nothing else is stated.''		''This section is written by DTU Nanolab internal if nothing else is stated.''
	[[Category:314]]
	[[Category:314-Microscopy]]		[[index.php?title=Category:314]]
			[[index.php?title=Category:314-Microscopy]]
	=Helios 5 Hydra UX DualBeam=		=Helios 5 Hydra UX DualBeam=

Jenk at 08:11, 27 June 2023

2023-06-27T08:11:42Z

← Older revision		Revision as of 10:11, 27 June 2023
Line 3:		Line 3:
	'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Microscopy_314-307/FIB/Helios click here]'''		'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Microscopy_314-307/FIB/Helios click here]'''

			''This section is written by DTU Nanolab internal if nothing else is stated.''
	[[Category:314]]		[[Category:314]]
	[[Category:314-Microscopy]]		[[Category:314-Microscopy]]

Fryma: /* Help to use */

2022-08-09T05:34:31Z

Help to use

← Older revision		Revision as of 07:34, 9 August 2022
Line 82:		Line 82:
	=Process information=		=Process information=

	=~~Help to use~~=		=Tips=
	Support PC can be accessed from the microscope PC using the remote desktop app (See Windows taskbar).		Support PC can be accessed from the microscope PC using the remote desktop app (See Windows taskbar).
	Alternatively switch input on the left monitor. HDMI is support PC. DP is microscope PC.		Alternatively switch input on the left monitor. HDMI is support PC. DP is microscope PC.

Fryma: /* Technical Notes */

2022-04-07T12:06:03Z

Technical Notes

← Older revision		Revision as of 14:06, 7 April 2022
Line 36:		Line 36:
	- Thermo Scientific EasyLift™ NanoManipulator for precise in situ sample manipulation		- Thermo Scientific EasyLift™ NanoManipulator for precise in situ sample manipulation

	- Everhart-Thornley SE detector (ETD)		- Everhart-Thornley detector (ETD)

	- ~~In-chamber electron and ion~~ detector (ICE) for secondary ions (SI) and electrons (SE)		- Charged particle detector (ICE) near the end of the ion column for detection of secondary ions (SI) and electrons (SE)

	- In-chamber Nav-Cam Sample Navigation Camera		- In-chamber Nav-Cam Sample Navigation Camera

Fryma: /* Helios 5 Hydra UX DualBeam */

2022-03-09T09:38:24Z

Helios 5 Hydra UX DualBeam

← Older revision		Revision as of 11:38, 9 March 2022
Line 7:		Line 7:
	=Helios 5 Hydra UX DualBeam=		=Helios 5 Hydra UX DualBeam=

	The Helios 5 Hydra UX DualBeam consists of two independent charged particle sources: 1- electrons, 2- plasma ions (choose from Xe, Ar, O or N). FEG-SEM with versatile characterization capabilities. At the time being, this microscope SEM provides highest resolution among all operational SEMs at DTU Nanolab, when operated for high resolution imaging (i.e. using low kV , in-lens detector, and in immersion mode~~)('''Correct? IF so remove from helios'''~~). This microscope is equipped with the following detectors: ETD (secondary electrons), ABS/CBS (backscatter electrons), ICE (secondary ions and electrons) etc.		The Helios 5 Hydra UX DualBeam consists of two independent charged particle sources: 1- electrons, 2- plasma ions (choose from Xe, Ar, O or N). FEG-SEM with versatile characterization capabilities. At the time being, this microscope SEM provides highest resolution among all operational SEMs at DTU Nanolab, when operated for high resolution imaging (i.e. using low kV , in-lens detector, and in immersion mode). This microscope is equipped with the following detectors: ETD (secondary electrons), ABS/CBS (backscatter electrons), ICE (secondary ions and electrons) etc.
	The plasma focused ion beam (PFIB) with inductively coupled plasma source supporting four ion species (Xe, Ar, O, N) provides the possibility of characterization of microstructures by imaging and serial sectioning via sputtering. The microscope is equipped with a nano manipulator for high quality TEM sample preparation and can with the AutoTEM software do automated lift-out procedures with high precision.		The plasma focused ion beam (PFIB) with inductively coupled plasma source supporting four ion species (Xe, Ar, O, N) provides the possibility of characterization of microstructures by imaging and serial sectioning via sputtering. The microscope is equipped with a nano manipulator for high quality TEM sample preparation and can with the AutoTEM software do automated lift-out procedures with high precision.
	The combination of PFIB sputtering capabilities, and 2-dimentional imaging facilitates 3-dimentional ~~characterization~~.		The combination of PFIB sputtering capabilities, and 2-dimentional imaging facilitates 3-dimentional imaging.
	With the Maps software, it is possible to make automated mapping of large areas for a higher resolution of the image.		With the Maps software, it is possible to make automated mapping of large areas for a higher resolution of the image.

Fryma: /* Who may operate Helios 5 Hydra UX DualBeam */

2022-03-09T09:36:18Z

Who may operate Helios 5 Hydra UX DualBeam

← Older revision		Revision as of 11:36, 9 March 2022
Line 76:		Line 76:
	** STEM3+ detector		** STEM3+ detector
	** ABS/CBS		** ABS/CBS

	~~'''Correct? Anything else?'''~~

	=Equipment performance and process related parameters=		=Equipment performance and process related parameters=

Fryma: /* Helios 5 Hydra UX DualBeam */

2022-03-07T07:44:06Z

Helios 5 Hydra UX DualBeam

← Older revision		Revision as of 09:44, 7 March 2022
Line 10:		Line 10:
	The plasma focused ion beam (PFIB) with inductively coupled plasma source supporting four ion species (Xe, Ar, O, N) provides the possibility of characterization of microstructures by imaging and serial sectioning via sputtering. The microscope is equipped with a nano manipulator for high quality TEM sample preparation and can with the AutoTEM software do automated lift-out procedures with high precision.		The plasma focused ion beam (PFIB) with inductively coupled plasma source supporting four ion species (Xe, Ar, O, N) provides the possibility of characterization of microstructures by imaging and serial sectioning via sputtering. The microscope is equipped with a nano manipulator for high quality TEM sample preparation and can with the AutoTEM software do automated lift-out procedures with high precision.
	The combination of PFIB sputtering capabilities, and 2-dimentional imaging facilitates 3-dimentional characterization.		The combination of PFIB sputtering capabilities, and 2-dimentional imaging facilitates 3-dimentional characterization.
			With the Maps software, it is possible to make automated mapping of large areas for a higher resolution of the image.

	=Reading Materials=		=Reading Materials=

Fryma: /* Who may operate Helios 5 Hydra UX DualBeam */

2022-03-07T07:31:31Z

Who may operate Helios 5 Hydra UX DualBeam

← Older revision		Revision as of 09:31, 7 March 2022
Line 71:		Line 71:

	*'''Users may only use the instrument to the extent they have been trained.''' This means that one should not try to operate the following options/capabilities without explicit training:		*'''Users may only use the instrument to the extent they have been trained.''' This means that one should not try to operate the following options/capabilities without explicit training:
	** NanoManipulator		** NanoManipulator (EasyLift needle)
	** Plasma cleaner		** Plasma cleaner
	** STEM3+ detector		** STEM3+ detector
			** ABS/CBS

	'''Correct? Anything else?'''		'''Correct? Anything else?'''

Fryma at 13:43, 18 February 2022

2022-02-18T13:43:58Z

← Older revision		Revision as of 15:43, 18 February 2022
Line 81:		Line 81:

	=Process information=		=Process information=

			=Help to use=
			Support PC can be accessed from the microscope PC using the remote desktop app (See Windows taskbar).
			Alternatively switch input on the left monitor. HDMI is support PC. DP is microscope PC.