Specific Process Knowledge/Bonding: Difference between revisions

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== Choose equipment ==
== Choose equipment ==
*EVG NIL
*[[/EVG NIL|EVG NIL]]
* [[Specific Process Knowledge/Thermal Process/C3 Furnace Anneal Bond|C3 furnace anneal bond]].
* [[Specific Process Knowledge/Thermal Process/C3 Furnace Anneal Bond|C3 furnace anneal bond]].

Revision as of 12:29, 13 March 2008

Choose bonding method

Comparing the three bonding methods in the EVG NIL

. Eutectic bonding Fusion bonding Anodic bonding
General description For bonding two substrates by use of an interphase that makes an eutecticum. For bonding two identical materials. For bonding Si and Glass.
Bonding temperature Depending on the eutecticum 310C to 400C. Depending on defects 50C to 400C. Depending on the voltage 300C to 500C Standard is 400C.
Annnealing temperature No annealing 1000C in the bond furnace C3 No annealing
Materials possible to bond Bonding of substrates is done by use of the eutectica Au/Si, Au/Sn and Au/Sn/Ni Si/Si, SiO/SiO Si/Pyrex (glass)
Substrate size Up to 6" (aligning only possible for 4" and 6") Up to 6" (aligning only possible for 4" and 6") Up to 6" (aligning only possible for 4" and 6")
Cleaning Cleaning by N2. Wet chemical cleaning, IMEC. Cleaning by N2.
IR alignment Double side polished wafers. Double side polished wafers. Not relevant.

Choose equipment