LabAdviser/CEN: Difference between revisions

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=<span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]]=
'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/LabAdviser/CEN click here]'''


'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/LabAdviser/CEN click here]'''
=This page gives an overview of the electron microscope equipment and other related resources connected to DTU Nanolab - building 307/314=


==SEM's==
==SEM==
*[[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|SEM Comparison page]]
*[[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|SEM Comparison page - all of DTU Nanolabs SEMs]]
*[[Specific Process Knowledge/Characterization/SEM FEI Nova 600 NanoSEM|SEM FEI Nova 600 NanoSEM]]
*[[/Nova NanoSEM 600|Nova NanoSEM 600]]
*[[Specific Process Knowledge/Characterization/SEM FEI Quanta 200 ESEM FEG|SEM FEI Quanta 200 ESEM FEG]]
*[[/Quanta FEG 200 ESEM|QFEG 200 Cryo ESEM]]
*[[Specific Process Knowledge/Characterization/SEM Inspect S|SEM Inspect S]]
*[[/AFEG 250 Analytical SEM|AFEG 250 Analytical ESEM]]
<!-- *[[/Inspect S|Inspect S]] -->


==Dual Beam's==
==Dual Beam==
*[[Specific Process Knowledge/Characterization/SEM FEI QUANTA 200 3D|Quanta 3D FIB/SEM]]
<!-- *[[/Quanta 3D FIB/SEM|Quanta 3D FIB/SEM]] -->
*[[Specific Process Knowledge/Characterization/Dual Beam FEI Helios Nanolab 600|Helios NanoLAB 600]]
*[[/Helios Nanolab 600|Helios NanoLAB 600]]


==TEM's==
==TEM==
*[[Specific Process Knowledge/Characterization/Titan ATEM |Titan ATEM]]
*[[/Titan ATEM |Titan ATEM]]
*[[Specific Process Knowledge/Characterization/Titan ETEM |Titan ETEM]]
*[[/Titan ETEM |Titan ETEM]]
*[[Specific Process Knowledge/Characterization/Tecnai TEM |Tecnai TEM]]
*[[/Tecnai TEM |Tecnai T20 TEM]]
*[[/Tecnai T12 Junior TEM |Tecnai T12 Junior TEM]]


==Ancillary Equipment==
==Ancillary Equipment==


*[[/Sample Preparation|Sample Preparation Overview]]
*[[/Ancillary Equipment|Optical microscopes]]
*Ion milling
*Pumping stations
*Polishing


*Saws
*[[/Ancillary Equipment#Optical Microscopes|Optical microscopes]]
*[[/Ancillary Equipment#Ion milling|Ion milling]]


*Plasma cleaner
*[[/Ancillary Equipment#Pumping stations|Pumping stations]]
*[[/Ancillary Equipment#Polishing|Polishing]]
*[[/Ancillary Equipment#Saws|Saws]]


*Coaters
*[[/Ancillary Equipment#Plasma cleaner|Plasma cleaner]]


*Sonicators
*[[/Ancillary Equipment#Coaters|Coaters]]


*Hot plates
*[[/Ancillary Equipment#Sonicators|Sonicators]]


*Plunger
*[[/Ancillary Equipment#Hot plates|Hot plates]]


*Microtomes
*[[/Ancillary Equipment#Plunger|Plunger]]


*Critical point dryer
*[[/Ancillary Equipment#Microtomes|Microtomes]]
*[[/Ancillary Equipment#Critical point dryer|Critical point dryer]]


*Centrifuge
*[[/Ancillary Equipment#Centrifuge|Centrifuge]]


*pH meter
*[[/Ancillary Equipment#pH meter|pH meter]]


==Post Processing==
==Post Processing==


*[[/Post Processing|Resources for Post Processing]]
*[[/Post Processing|Resources for Post Processing]]

Latest revision as of 15:20, 16 March 2020