LabAdviser/314/Preparation 314-307/Solid-matter

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This section is written by DTU Nanolab internal if nothing else is stated.

Mechanical preparation equipment is available for experience users, who know how to use the equipment. Access to the preparation lab is needed. We do not provide training on the equipment.

Cutting

Struers Minitom

Brochure

Location Building 307, Prep Lab 109

Well Precision Diamond Wire Saw

Brochure

Location Building 307, Prep Lab 109

Ultrasonic cutter

Manual - requires login

Location Building 307, Prep Lab 109

.

Grinding/Polishing

TechPrep Allied

The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation.

Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill.

Brochure

Location Building 307, Prep Lab 109

Dimple Grinder

Manual - requires login

Location Building 307, Prep Lab 109

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Ion Milling

Fischione Low Angle Ion Milling and Polishing System Model 1010

The Fischione Ion Mill is used for producing TEM specimens with large electron transparent areas. Samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The milling or polishing is performed by argon ions. The instrument has two independently adjustable Hollow Anode Discharge (HAD) argon ion sources, which can be operated from 0.5 to 6.0 kV with currents from 3 mA to 8 mA. The milling angle can be adjusted in the range of 0° to 45°. Tuning the milling parameters allows for coarse or gentle milling and the goal is to get clean samples free of physical or chemical artifacts

Manual - requires login

Location Building 307, Prep Lab 109

.

Fischione NanoMill model 1040

This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.

Brochure

Location Building 314, Common Area

Sample preparation processes

Here we collected a few sample preparation processes done at DTU Nanolab building 314/307:

• FIB lamella preparation