LabAdviser/314/Microscopy 314-307/TEM

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TEM

Transmission Electron Microscopy (TEM) is a technique, where accelerated electrons penetrate a thin sample and are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.


We have four TEMs available at DTU Nanolab. Click on the instrument to find more information about the equipment and available techniques:

Tecnai T12 Biotwin Tecnai T12 Tecnai T20 Tecnai T20 Titan ATEM Titan ATEM Titan ETEM Titan ETEM


Comparison between TEMs at DTU Nanolab - building 314/307

Microscope

T12

T20

ATEM

ETEM

Purpose
  • TEM characterization
  • Spectroscopic charaterization
  • TEM characterization
  • STEM characterization
  • Spectroscopic charaterization
  • High-resolution STEM imaging
  • Analytical microscopy
  • Holography
  • High-resolution TEM imaging
  • ETEM experiments
  • Spectroscopic charaterization
Resolution TEM mode

>3.5 Å

1.44 Å

1.02 Å

0.9 Å

STEM mode

no STEM

about 10 Å

0.8 Å

1.36 Å

Spectroscopy EDX

Oxford X-Max 80T/AZtec

Oxford X-Max 80T/AZtec

Oxford X-Max 100TLE/AZtec

Oxford X-Max 80T/AZtec

EELS

no EELS

Gatan 863 Tridiem GIF

Gatan 865 Tridiem GIF

Gatan 866 Tridiem GIF



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