Specific Process Knowledge/Thin film deposition/Furnace LPCVD Nitride: Difference between revisions

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{| border="2" cellspacing="0" cellpadding="10" align="right"
{| border="2" cellspacing="0" cellpadding="10"  
! .
! LPCVD
|-  
|-  
| Stoichiometry
|Purpose ||Deposition of silicon nitride ||Stoichiometry:
|
*Si<sub>3</sub>N<sub>4</sub>
*Si<sub>3</sub>N<sub>4</sub>
*SRN
*SRN
SRN: Silicon Rich Nitride
SRN: Silicon Rich Nitride
|-
|-
|Film thickness
|Performance||Film thickness||
|
*Si<sub>3</sub>N<sub>4</sub>:~50Å - ~3000Å
*Si<sub>3</sub>N<sub>4</sub>:~50Å - ~3000Å
*SRN: ~50Å - ~10000Å
*SRN: ~50Å - ~10000Å
|-
|-
|Step coverage
|||Step coverage
|
|
*Good
*Good
|-
|-
|Film quality
|||Film quality
|
|
*Dense film
*Dense film
*Few defects
*Few defects
|-
|-
|Process Temperature
|Process parameter range||Process Temperature
|
|
*800-835 <sup>o</sup>C
*800-835 <sup>o</sup>C
|-
|-
|Batch size
|||Process pressure
|
*80-230 mTorr
|-
|||Gas flows
|
*SiH<math>_2</math>Cl<math>_2</math>:10-100 sccm
*NH<math>_3</math>:10-75 sccm
|-
|Substrates||Batch size
|
|
*1-25 4" wafer per run
*1-25 4" wafer per run
*deposition on both sides of the substrate
*deposition on both sides of the substrate
|-
|-
| Substrate material allowed
||| Substrate material allowed
|
|
*Silicon wafers
*Silicon wafers (new from the box or RCA cleaned)
**with layers of silicon oxide or silicon (oxy)nitride
**with layers of silicon oxide or silicon (oxy)nitride (RCA cleaned)
*Quartz wafers
*Quartz wafers (RCA cleaned)
|-  
|-  
|}
|}

Revision as of 09:53, 4 December 2007

At the moment we have one LPCVD furnace for nitride depositions.


A few words about the furnace

The furnace is a Tempress horisontal furnace. The process is a batch process meaning you can run a batch of 25 wafers at a time. The deposition takes place at temperatures of 800-835 degrees Celsius. The reactive gases are Ammonia and dichlorsilane. The LPCVD nitride has a good step coverage and the film thickness is very uniform over the wafer. We have two standard LPCVD nitride processes: One for depositing stoichiometric nitride (Si3N4) and one for deposition of low stress nitride (SNR). To get information on how to operate the furnace please read the manual which is uploaded to LabManager.

Process Knowledge

Purpose Deposition of silicon nitride Stoichiometry:
  • Si3N4
  • SRN

SRN: Silicon Rich Nitride

Performance Film thickness
  • Si3N4:~50Å - ~3000Å
  • SRN: ~50Å - ~10000Å
Step coverage
  • Good
Film quality
  • Dense film
  • Few defects
Process parameter range Process Temperature
  • 800-835 oC
Process pressure
  • 80-230 mTorr
Gas flows
  • SiHCl:10-100 sccm
  • NH:10-75 sccm
Substrates Batch size
  • 1-25 4" wafer per run
  • deposition on both sides of the substrate
Substrate material allowed
  • Silicon wafers (new from the box or RCA cleaned)
    • with layers of silicon oxide or silicon (oxy)nitride (RCA cleaned)
  • Quartz wafers (RCA cleaned)

Please take a look at the process side for deposition of Silicon Nitride using LPCVD: Deposition of Silicon Nitride using LPCVD

To the right you see a rough overview of the performance of LPCVD Silicon Nitride and some process related parameters.