LabAdviser/314/Preparation 314-307/Solid-matter: Difference between revisions
No edit summary |
No edit summary |
||
| Line 31: | Line 31: | ||
= Grinding/Polishing = | = Grinding/Polishing = | ||
<!-- | |||
== Struers Labopol -25 == | == Struers Labopol -25 == | ||
| Line 38: | Line 39: | ||
<br clear="all" /> | <br clear="all" /> | ||
--> | |||
== TechPrep Allied == | == TechPrep Allied == | ||
| Line 50: | Line 51: | ||
<br clear="all" /> | <br clear="all" /> | ||
<!-- | |||
== Struers Labopol -5 == | == Struers Labopol -5 == | ||
| Line 66: | Line 67: | ||
<br clear="all" /> | <br clear="all" /> | ||
--> | |||
== Dimple Grinder == | == Dimple Grinder == | ||
Revision as of 09:25, 25 November 2021
Feedback to this page: click here
Cutting
Struers Minitom
Well Precision Diamond Wire Saw
Ultrasonic cutter
.
Grinding/Polishing
TechPrep Allied
The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation.
Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill.
Dimple Grinder
.
Ion Milling
Fischione Low Angle Ion Milling and Polishing System Model 1010
The Fischione Ion Mill is used for producing TEM specimens with large electron transparent areas. Samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The milling or polishing is performed by argon ions. The instrument has two independently adjustable Hollow Anode Discharge (HAD) argon ion sources, which can be operated from 0.5 to 6.0 kV with currents from 3 mA to 8 mA. The milling angle can be adjusted in the range of 0° to 45°. Tuning the milling parameters allows for coarse or gentle milling and the goal is to get clean samples free of physical or chemical artifacts
File:Operation Manual Fischione_1010.pdf
.
Fischione NanoMill model 1040
This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.
Missing equipment
Mini grinder/polisher
Sample preparation processes
Here we collected a few sample preparation processes done at DTU Nanolab building 314/307: