Specific Process Knowledge/Thin film deposition/Furnace LPCVD Nitride: Difference between revisions

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==LPCVD (Low Pressure Chemical Vapor Deposition) Silicon Nitride==
==LPCVD (Low Pressure Chemical Vapor Deposition) Silicon Nitride==
[[image:Furnace_nitride1.jpg|300x300px|right|thumb|B2 Furnace LPCVD Nitride: positioned in cleanroom 2]]
[[image:Furnace_nitride1.jpg|300x300px|right|thumb|B2 Furnace LPCVD Nitride: positioned in cleanroom 2]]
At the moment there is one furnace for silicon nitride depositions at Danchip. The furnace is a Tempress horizontal furnace. The process is a batch process meaning you can run a batch of 25 wafers at a time. The deposition takes place at temperatures of 800-835 degrees Celsius. The reactive gases are Ammonia and dichlorsilane. The LPCVD nitride has a good step coverage and the film thickness is very uniform over the wafer. We have two standard LPCVD nitride processes: One for depositing stoichiometric nitride (Si<sub>3</sub>N<sub>4</sub>) and one for deposition of low stress nitride (SNR). To get information on how to operate the furnace please read the manual which is uploaded to LabManager.
At Danchip there are two LPCVD nitride furnaces for deposition of silicon nitride: A new furnace for deposition of stoichiometric nitride on 4" or 6" wafers and a older furnace for deposition of stoichiometric nitride and low stress nitride on 4" wafers. Both furnaces are Tempress horizontal furnaces.  
 
The LPCVD silicon nitride deposition is a batch process, meaning that you can run a batch of up to 25-35 wafers at a time. The deposition takes place at temperatures of 780-835 degrees Celsius. The reactive gases are ammonia (NH<sub>3</sub>) and dichlorsilane (SiH<sub>2</sub>Cl<sub>2</sub>). The LPCVD nitride has a good step coverage, and the film thickness is very uniform over the wafers. On the old nitride furnace we have two standard silicon nitride processes: One for deposition of stoichiometric nitride (Si<sub>3</sub>N<sub>4</sub>) and one for deposition of low stress nitride (SNR). On the new nitride furnace we have two standard recipes for deposition of stoichiometric nitride: One for 4" wafers and one for 6" wafers.
 
To get information on how to operate the furnace please read the user manuals which are uploaded to LabManager on the machine page.


==Process Knowledge==
==Process Knowledge==

Revision as of 12:01, 16 December 2008

LPCVD (Low Pressure Chemical Vapor Deposition) Silicon Nitride

B2 Furnace LPCVD Nitride: positioned in cleanroom 2

At Danchip there are two LPCVD nitride furnaces for deposition of silicon nitride: A new furnace for deposition of stoichiometric nitride on 4" or 6" wafers and a older furnace for deposition of stoichiometric nitride and low stress nitride on 4" wafers. Both furnaces are Tempress horizontal furnaces.

The LPCVD silicon nitride deposition is a batch process, meaning that you can run a batch of up to 25-35 wafers at a time. The deposition takes place at temperatures of 780-835 degrees Celsius. The reactive gases are ammonia (NH3) and dichlorsilane (SiH2Cl2). The LPCVD nitride has a good step coverage, and the film thickness is very uniform over the wafers. On the old nitride furnace we have two standard silicon nitride processes: One for deposition of stoichiometric nitride (Si3N4) and one for deposition of low stress nitride (SNR). On the new nitride furnace we have two standard recipes for deposition of stoichiometric nitride: One for 4" wafers and one for 6" wafers.

To get information on how to operate the furnace please read the user manuals which are uploaded to LabManager on the machine page.

Process Knowledge

Please take a look at the process side for deposition of Silicon Nitride using LPCVD: Deposition of Silicon Nitride using LPCVD


Overview of the performance of LPCVD Silicon Nitride and some process related parameters

Purpose Deposition of silicon nitride Stoichiometry:
  • Si3N4
  • SRN

SRN: Silicon Rich Nitride

Performance Film thickness
  • Si3N4:~50Å - ~3000Å
  • SRN: ~50Å - ~10000Å
Step coverage
  • Good
Film quality
  • Dense film
  • Few defects
Process parameter range Process Temperature
  • 800-835 oC
Process pressure
  • 80-230 mTorr
Gas flows
  • SiHCl:10-100 sccm
  • NH:10-75 sccm
Substrates Batch size
  • 1-25 4" wafer per run
  • Deposition on both sides of the substrate
Substrate material allowed
  • Silicon wafers (new from the box or RCA cleaned)
    • with layers of silicon oxide or silicon (oxy)nitride (RCA cleaned)
  • Quartz wafers (RCA cleaned)