Specific Process Knowledge/Lithography/Descum: Difference between revisions
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=Plasma asher 3= | =Plasma asher 3= | ||
'''The user manual(s), quality control procedure(s) and results and contact information can be found in [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=423 LabManager].''' | |||
Plasma Asher 3 is specifically used for controlled descum process after lithography. Please note that you only can process a single 100 mm wafer, or one small sample, at a time. | Plasma Asher 3 is specifically used for controlled descum process after lithography. Please note that you only can process a single 100 mm wafer, or one small sample, at a time. |
Revision as of 12:05, 30 January 2023
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Plasma asher 1
The user manual(s), quality control procedure(s) and results and contact information can be found in LabManager.
Descum of AZ5214E resist on 50mm silicon wafer. Wafer was placed horisontally in chamber on a 100 mm carier wafer.
Recipe 1:
Note: Plasma asher was cold before use
- O2 flow: 70 ml/min
- N2 flow: 70 ml/min
- Power: 150 W
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Recipe 2:
Note: Plasma asher was cold before use
- O2 flow: 500 ml/min
- N2 flow: 0 ml/min
- Power: 500 W
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Descum tests on UV resists
Conny Hjort & Jesper Hanberg, September 2021
Descum of different resists, AZ5214E, AZ701 MiR and AZ2020 nLOF, on a single 100mm wafer was tested. Wafer was placed vertically in the middle of glass carrier.
Recipe settings:
Note: plasma Asher was cold before use.
- O2 flow: 70 ml/min
- N2 flow: 70 ml/min
Power: 150 W
Minor temperature rise during processing was observed, but not more than 5 degrees. Starting chamber pressure was around 0.5 mbar.
1,5 um AZ5214E resist:
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1,5 um AZ5214E resist placed horizontally in the carrier:
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1,5 um AZ701MiR resist:
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1,5 um AZ 2020nLOF resist:
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Plasma asher 2
Jitka Urbánková & Jesper Hanberg, December 2019
The user manual(s), quality control procedure(s) and results and contact information can be found in LabManager.
Descum of AZ Mir 701 resist on 100mm silicon wafer. Five wafers were placed vertically in chamber.
recipe 1:
- O2 flow: 100 ml/min
- N2 flow: 100 ml/min
- Power: 150 W
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recipe 2:
- O2 flow: 500 ml/min
- N2 flow: 0 ml/min
- Power: 200 W
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A linear time dependence was observed after etching 7 minutes or more (recipe 2).
Plasma asher 3
The user manual(s), quality control procedure(s) and results and contact information can be found in LabManager.
Plasma Asher 3 is specifically used for controlled descum process after lithography. Please note that you only can process a single 100 mm wafer, or one small sample, at a time. The plasma asher is equipped with 2 gaslines: oxygen and nitrogen, but all standard processes use only oxygen (as recommended by Diener).
Ashing of AZ MiR701 resist:
You can use two different descum process developments: you can either change power settings or processing chamber pressure.
Testing different power settings:
Recipe settings:
- O2 flow: 5 sccm
- N2 flow: 0
- Pressure: 0.2 mbar
- Power: Varied
Experiment parameters:
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Testing different pressure settings:
Recipe settings:
- O2 flow: varied
- N2 flow: 0
- Pressure: varied
- Power: V100% (100 W)
Experiment parameters:
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Ashing of AZ5214E resist:
Recipe settings:
- O2 flow: varied
- N2 flow: 0
- Pressure: varied
- Power: V100% (100 W)
Experiment parameters:
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