LabAdviser/314/Preparation 314-307/Solid-matter: Difference between revisions
| Line 52: | Line 52: | ||
<br clear="all" /> | <br clear="all" /> | ||
== | == Struers Labopol -4 == | ||
[https://www.struers.com/-/media/Library/Instruction-Manuals/English/Grinding-and-polishing/LaboPol-1-2-4-5-6-15207001-EN-Revision-0.pdf?dmc=1&ts=20180928T1014301571 User manual] | [https://www.struers.com/-/media/Library/Instruction-Manuals/English/Grinding-and-polishing/LaboPol-1-2-4-5-6-15207001-EN-Revision-0.pdf?dmc=1&ts=20180928T1014301571 User manual] | ||
Revision as of 15:47, 9 June 2020
THIS PAGE IS UNDER CONSTRUCTION
Feedback to this page: click here
Cutting
Struers Minitom
Well Precision Diamond Wire Saw
Grinding/Polishing
Struers Labopol -25
TechPrep Allied
The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation.
Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill.
Struers Labopol -5
Struers Labopol -4
Ion Milling
Fischione Low Angle Ion Milling and Polishing System Model 1010
The Fischione Ion Mill is used for producing TEM specimens with large electron transparent areas. Samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The milling or polishing is performed by argon ions. The instrument has two independently adjustable Hollow Anode Discharge (HAD) argon ion sources, which can be operated from 0.5 to 6.0 kV with currents from 3 mA to 8 mA. The milling angle can be adjusted in the range of 0° to 45°. Tuning the milling parameters allows for coarse or gentle milling and the goal is to get clean samples free of physical or chemical artifacts
File:Operation Manual Fischione_1010.pdf
.
Fischione NanoMill model 1040
This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.
Missing equipment
Dimple grinder
Mini grinder/polisher
Ultrasonic cutter
Sample preparation processes
Here we collected a few sample preparation processes done at DTU Nanolab building 314/307: