LabAdviser/314/Preparation 314-307/Solid-matter: Difference between revisions
Created page with "<span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>200px '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu...." |
No edit summary |
||
| Line 1: | Line 1: | ||
<span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] | <span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] | ||
= Cutting = | |||
== Struers Minitom == | |||
[http://www.struers.com/default.asp?doc_id=262 Brochure] | |||
[[File:IMG_3664.JPG|200px|left|thumb|Location Building 307, Prep Lab 109]]<br /> | |||
<br clear="all" /> | |||
== Well Precision Diamond Wire Saw == | |||
[http://www.hititmetal.com/urun/metalografi/3000_seri.pdf Brochure] | |||
[[File:IMG_3665.JPG|200px|left|thumb|Location Building 307, Prep Lab 109]]<br /> | |||
<br clear="all" /> | |||
= Grinding/Polishing = | |||
== Struers Labopol -25 == | |||
[http://www.struers.com/default.asp?top_id=2&main_id=93&sub_id=145&doc_id=534 Brochure] | |||
[[File:labopol25.png|200px|left|thumb|Location Building 307, Prep Lab 109]]<br /> | |||
<br clear="all" /> | |||
== TechPrep Allied == | |||
The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation. | |||
Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill. | |||
[http://www.alliedhightech.com/Equipment/multiprep-polishing-system-8/ Brochure] | |||
[[File:TechPrep.png|200px]|left|thumb|Location Building 307, Prep Lab 109]]<br /> | |||
<br clear="all" /> | |||
== Struer Labopol -5 == | |||
[[File:Labopol5.png|200px]|left|thumb|Location Building 307, Prep Lab 109]]<br /> | |||
<br clear="all" /> | |||
== Struer Labopol -4 == | |||
[[File:Labopol4.png|200px|left|thumb|Location Building 307, Prep Lab 109]]<br /> | |||
<br clear="all" /> | |||
= Missing equipment = | |||
== Dimple grinder == | |||
== Mini grinder/polisher == | |||
== Ultrasonic cutter == | |||
= Ion Milling = | |||
== Fischione Low Angle Ion Milling and Polishing System Model 1010 == | |||
The Fischione Ion Mill is used for producing TEM specimens with large electron transparent areas. Samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The milling or polishing is performed by argon ions. The instrument has two independently adjustable Hollow Anode Discharge (HAD) argon ion sources, which can be operated from 0.5 to 6.0 kV with currents from 3 mA to 8 mA. The milling angle can be adjusted in the range of 0° to 45°. Tuning the milling parameters allows for coarse or gentle milling and the goal is to get clean samples free of physical or chemical artifacts | |||
[[:File:Operation Manual Fischione_1010.pdf]] | |||
[[File:IMG_3674.JPG|300px|left|thumb|Location Building 307, Prep Lab 109]].<br /> | |||
<br clear="all" /> | |||
== Fischione NanoMill model 1040 == | |||
This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. | |||
[http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system Operation Manual] | |||
[[File:IMG_3679.JPG|250px|left|thumb|Location Building 314, Common Area]] | |||
<br clear="all" /> | |||
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Preparation_314-307/Solid-mater click here]''' | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Preparation_314-307/Solid-mater click here]''' | ||
Revision as of 11:15, 23 March 2020
THIS PAGE IS UNDER CONSTRUCTION
Cutting
Struers Minitom
Well Precision Diamond Wire Saw
Grinding/Polishing
Struers Labopol -25
TechPrep Allied
The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation.
Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill.
Struer Labopol -5
Struer Labopol -4
Missing equipment
Dimple grinder
Mini grinder/polisher
Ultrasonic cutter
Ion Milling
Fischione Low Angle Ion Milling and Polishing System Model 1010
The Fischione Ion Mill is used for producing TEM specimens with large electron transparent areas. Samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The milling or polishing is performed by argon ions. The instrument has two independently adjustable Hollow Anode Discharge (HAD) argon ion sources, which can be operated from 0.5 to 6.0 kV with currents from 3 mA to 8 mA. The milling angle can be adjusted in the range of 0° to 45°. Tuning the milling parameters allows for coarse or gentle milling and the goal is to get clean samples free of physical or chemical artifacts
File:Operation Manual Fischione_1010.pdf
.
Fischione NanoMill model 1040
This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.
Feedback to this page: click here