LabAdviser/314/Microscopy 314-307/SEM: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Microscopy_314-307/SEM click here]''' | |||
''This section is written by DTU Nanolab internal if nothing else is stated.'' | |||
[[Category:314]] | |||
[[Category:314-Microscopy]] | |||
= SEM = | = SEM = | ||
Scanning Electron Microscopy (SEM) is a technique, where a | Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondar generated electrons are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses. | ||
We have | We have five SEMs available at DTU Nanolab in building 314. Click on the instrument to find more information about the equipment and available techniques: | ||
{| border="0" cellspacing="75" | {| border="0" cellspacing="75" style="margin: auto;" | ||
|+ | |+ | ||
| align="center" width="200px" heigth="250px" | ''' | | align="center" width="200px" heigth="250px" | '''Nova''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/SEM/Nova|Nova ]] | ||
| align="center" width="200px" | '''QFEG''' [[image:Microscopy- | | align="center" width="200px" | '''QFEG''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM/QFEG|QFEG ]] | ||
| align="center" width="200px" | ''' | | align="center" width="200px" | '''AFEG''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM/AFEG|AFEG ]] | ||
| align="center" width="200px" | '''Helios''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB/Helios|Helios ]] | |||
| align="center" width="200px" | '''Hydra''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB/Hydra|Hydra ]] | |||
|} | |} | ||
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{{SEM comparison table 314}} | {{SEM comparison table 314}} | ||
Latest revision as of 10:10, 27 June 2023
Feedback to this page: click here
This section is written by DTU Nanolab internal if nothing else is stated.
SEM
Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondar generated electrons are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.
We have five SEMs available at DTU Nanolab in building 314. Click on the instrument to find more information about the equipment and available techniques:
Nova | QFEG | AFEG | Helios | Hydra |
Comparison between SEMs at DTU Nanolab - building 314/307
Equipment | Nova | QFEG | AFEG | Helios | |
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Equipment position | Building 314 Room 060 | Building 314 Room 011 | Building 314 Room 034 | Building 314 Room 061 | |
Resolution | The resolution of a SEM is strongly dependent on sample type and the operator. Resolution quoted is using sputtered gold on carbon | ||||
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Detectors |
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Stage specifications |
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Options | B | C | D | E | |
Max sample size | Consult with DTU Nanolab staff as weight, dimensions, pumping capacity and technique all play a roll in the sample size |