View source for Specific Process Knowledge/Characterization/XRD/Process Info/The Principles of X-ray Reflectivity Analysis

=Experimental setup=
<gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="700px" heights="150px" perrow="2">
image:eves_XRD_drawing_series_XRR1_20230206.png|<b>C 1s</b> signal.
image:eves_XRD_drawing_series_XRR2_20230206.png|<b>C 1s</b> signal.
</gallery>

=Beam propagation=
<gallery caption="XRR analysis concept." widths="800px" heights="300px" perrow="1">
image:eves_XRR_concept_20230203.png| Reflection and transmission from a thin film. Total reflectivity is the sum of the infinite number of reflections. 
</gallery>

=Thickness, roughness and density influence=

<gallery caption="XRR analysis concept." widths="450px" heights="650px" perrow="3">
image:eves_XRD_XRR_principles_thickness.png| Reflection and transmission from a thin film. Total reflectivity is the sum of the infinite number of reflections. 
image:eves_XRD_XRR_principles_roughness.png| Reflection and transmission from a thin film. Total reflectivity is the sum of the infinite number of reflections. 
image:eves_XRD_XRR_principles_density.png| Reflection and transmission from a thin film. Total reflectivity is the sum of the infinite number of reflections. 
</gallery>